Related papers: Wire Scanners for Small Emittance Beam Measurement…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…
We discuss a scenario to extract up to 150 MeV neutrinos at a standard beta-beam facility using one and two detectors off-axis. In particular we show that the high-energy component of the neutrino fluxes can be subtracted through a specific…
Far-infrared detectors for future cooled space telescopes require ultra-sensitive detectors with optical noise equivalent powers of order 0.2 aW/\sqrt Hz. This performance has already been demonstrated in arrays of transition edge sensors.…
The light emission rate from a scanning tunneling microscope (STM) scanning a noble metal surface is calculated taking retardation effects into account. As in our previous, non-retarded theory [Johansson, Monreal, and Apell, Phys. Rev. B…
Fast procedures for the beam quality assessment and for the monitoring of beam energy modulations during the irradiation are among the most urgent improvements in particle therapy. Indeed, the online measurement of the particle beam energy…
Electron beams of linear induction accelerators experience deflective forces caused by RF fields building up as a result of accelerating cavities of finite size. These forces can significantly effect the beam when a long linac composed of…
Transverse 2D phase space distribution of a 2.1 MeV, 5 mA H$^-$ beam is measured at the PIPIT test accelerator at Fermilab with an Allison scanner. The paper describes the design, calibration, and performance of the scanner as well as the…
We have characterized a semiconductor amplifier laser system which provides up to 200mW output after a single-mode optical fiber at 780nm wavelength. The system is based on a tapered semiconductor gain element, which amplifies the output of…
We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…
Coaxial wire measurements have provided a simple and effective way to measure the beam coupling impedance of accelerator structures for a number of years. It has been known how to measure the longitudinal and dipolar transverse impedance…
A simple self-referenced non destructive method is proposed for measuring the cutoff wavelength of microstructured optical fibers (MOFs). It is based on the analysis of the time dependent optical power transmitted through a bow-tie slit…
Phased array feeds (PAFs) for reflector antennas offer the potential for increased reflector field of view and faster survey speeds. To address some of the development challenges that remain for scientifically useful PAFs, including…
The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
Results obtained with a new very compact detector for imaging with a matrix of Leak Microstructures (LM)are reported. Spatial linearity and spatial resolution obtained by scanning as well as the detection of alpha particles with 100%…
Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…
New crystal technique - array of bent strips and a fan-type reflector, based on thin straight plates - have been used for research of extraction and collimation a circulating beam in the U-70 accelerator at the energy 50 GeV and 1.3 GeV. It…
Precise alignment of the electron beam is critical for successful application of scanning transmission electron microscopes (STEM) to understanding materials at atomic level. Despite the success of aberration correctors, aberration…
Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-{\AA}ngstr\"om. The…
Neutron energy spectrum from 120 GeV protons on a thick copper target was measured at the Meson Test Beam Facility (MTBF) at Fermi National Accelerator Laboratory. The data allows for evaluation of neutron production process implemented in…