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An analytical solution of the equations describing impurity diffusion due to the migration of nonequilibrium impurity interstitial atoms was obtained for the case of the Robin boundary condition on the surface of a semiconductor. The…

Materials Science · Physics 2008-02-26 O. I. Velichko , N. A. Sobolevskaya

Modeling of radiation-enhanced diffusion of boron and phosphorus atoms during irradiation of silicon substrates respectively with high- and low-energy protons was carried out. The results obtained confirm the previously arrived conclusion…

Materials Science · Physics 2014-07-15 Oleg Velichko

The equation of impurity diffusion due to formation, migration, and dissolution of the pairs "impurity atom - intrinsic point defect" taking into account the nonuniform distributions of nonequilibrium point defects and drift of the pairs in…

Materials Science · Physics 2011-06-14 O. I. Velichko , V. A. Burko

To simulate the transient enhanced diffusion near the surface or interface, a set of equations describing the impurity diffusion and quasichemical reactions of dopant atoms and point defects in ion-implanted layers is proposed and analyzed.…

Materials Science · Physics 2007-05-23 O. I. Velichko , Yu. P. Shaman , A. K. Fedotov , A. V. Masanik

The analytical solution of the equation describing diffusion of intrinsic point defects has been obtained for a one-dimensional finite-length domain. This solution is intended for investigating and modeling the changes in defect…

Materials Science · Physics 2014-06-26 O. I. Velichko

Modeling of the phosphorus radiation-enhanced diffusion in the course of implantation of high-energy protons into an elevated-temperature silicon substrate and during its treatment in a hydrogen-containing plasma with addition of a…

Materials Science · Physics 2014-10-24 O. I. Velichko

It has been shown that many of the phenomena related to the formation of "tails" in the low-concentration region of ion-implanted impurity distribution are due to the anomalous diffusion of nonequilibrium impurity interstitials. These…

Materials Science · Physics 2015-05-30 O. I. Velichko , A. P. Kavaliova

A model of interstitial impurity migration is proposed which explains the redistribution of ion-implanted boron in low-temperature annealing of nonamorphized silicon layers. It is supposed that nonequilibrium boron interstitials are…

Materials Science · Physics 2015-04-15 O. I. Velichko

The mechanism underlying the long-range interstitial migration of nonequilibrium impurity interstitial species is used to simulate arsenic redistribution in ion implantation. An excellent agreement of the calculated arsenic concentration…

Materials Science · Physics 2015-06-11 O. I. Velichko

The model of hydrogen migration and of the reactions of hydrogen atoms with electrically active impurity, developed earlier, has been applied to simulate hydrogen diffusion and passivation process during plasma deuteration of silicon…

Materials Science · Physics 2015-06-12 O. I. Velichko , Yu. P. Shaman , A. P. Kovaliova

Modeling of ion-implanted boron redistribution in silicon crystals during low-temperature annealing with a small thermal budget has been carried out. It was shown that formation of "tails"' in the low-concentration region of impurity…

Materials Science · Physics 2015-06-05 O. I. Velichko , A. P. Kavaliova

It has been shown by means of impurity diffusion simulation that ion-implanted boron redistribution at the annealing temperatures 800^{\circ}C and lower is governed by the long-range migration of nonequilibrium impurity interstitials…

Materials Science · Physics 2011-06-27 O. I. Velichko , A. P. Kavaliova

An analysis of the equations used for modeling thermal arsenic diffusion in silicon has been carried out. It was shown that for arsenic diffusion governed by the vacancy-impurity pairs and the pairs formed due to interaction of impurity…

Materials Science · Physics 2015-04-28 O. I. Velichko

It has been shown that during thermal treatments of silicon layers preamorphized by germanium implantation and then implanted with boron ions the transport of impurity atoms occurs right up to a temperature of 850^{\circ}C due to migration…

Materials Science · Physics 2011-06-20 O. I. Velichko , A. A. Hundorina , V. V. Axenov

A two stream model of boron diffusion in silicon has been developed. The model is intended for simulation of transient enhanced diffusion including redistribution of ion-implanted boron during low temperature annealing. The following…

Materials Science · Physics 2011-05-24 O. I. Velichko , A. A. Hundorina

A theoretical investigation of the microscopic mechanisms provided the transient enhanced diffusion of boron atoms during rapid thermal annealing of silicon substrates doped by high fluence ion implantation was carried out. To compare the…

Mesoscale and Nanoscale Physics · Physics 2010-07-23 O. I. Velichko , A. A. Hundoryna

Tuning of the electronic properties of pre-synthesized colloidal semiconductor nanocrystals (NCs) by doping plays a key role in the prospect of implementing them in printed electronics devices such as transistors, and photodetectors. While…

Materials Science · Physics 2021-05-25 Yorai Amit , Yuanyuan Li , Anatoly I. Frenkel , Uri Banin

A model of the interstitial diffusion of ion-implanted boron during rapid thermal annealing of silicon layers previously amorphized by implantation of germanium has been proposed. It is supposed that the boron interstitials are generated…

Materials Science · Physics 2009-05-01 O. I. Velichko , N. V. Kniazhava

Present divertor concepts for next step experiments such ITER and TPX rely upon impurity and hydrogen radiation to transfer the energy from the edge plasma to the main chamber and divertor chamber walls. The efficiency of these processes…

plasm-ph · Physics 2009-10-28 D. Post , N. Putvinskaya , F. W. Perkins , W. Nevins

In this work we first study the quantum diffusion in a volume of a crystalline solid at high interstitial concentrations when the effects of the short-range interactions between the diffusing particles are to be factors. Within the scope of…

Materials Science · Physics 2007-05-23 G. L. Buchbinder , V. N. Shapov
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