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A nanoscopy technique that can characterize light-matter interactions with ever increasing spatial resolution and signal-to-noise ratio (SNR) is desired for spectroscopy at molecular levels. Photoinduced force microscopy (PiFM) with…

Applied Physics · Physics 2018-10-17 Mohsen Rajaei , Mohammad Ali Almajhadi , Jinwei Zeng , H. Kumar Wickramasinghe

A nanometric needle sensor mounted in an Atomic Force Microscopy allows systematic picometer-range distance measurements. This force sensing device is used in Piezoresponse Force Microscopy (PFM) as a distance sensor, by employing the…

Materials Science · Physics 2017-12-01 A. Gomez , H. T. T Nong , S. Mercone , T. Puig , X. Obradors

Piezoresponse Force Spectroscopy (PFS) is a powerful method widely used for measuring the nanoscale ferroelectric responses of the materials. However, it is found that certain non-ferroelectric materials can also generate similar responses…

Materials Science · Physics 2018-09-13 Yue Liu , Yao Sun , Wanheng Lu , Hongli Wang , Zhongting Wang , Bingxue Yu , Tao Li , Kaiyang Zeng

Structured metallic tips are increasingly important for optical spectroscopies such as tip-enhanced Raman spectroscopy (TERS), with plasmonic resonances frequently cited as a mechanism for electric field enhancement. We probe the local…

Magnetic resonance force microscopy (MRFM) is a scanning probe technique capable of detecting MRI signals from nanoscale sample volumes, providing a paradigm-changing potential for structural biology and medical research. Thus far, however,…

Scanning probe experiments such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM) on strongly correlated electronic systems often reveal complex pattern formation on multiple length scales. By studying the universal…

Strongly Correlated Electrons · Physics 2019-04-03 L. Burzawa , Shuo Liu , E. W. Carlson

Ferroelectric materials possess spontaneous polarization that can be used for multiple applications. Owing to a long term development for reducing the sizes of devices, the preparation of ferroelectric materials and devices are entering…

Multi-tip scanning tunneling microscopy (STM) is a powerful method to perform charge transport measurements at the nanoscale. With four STM tips positioned on the surface of a sample, four-point resistance measurements can be performed in…

Mesoscale and Nanoscale Physics · Physics 2022-01-28 A. Leis , V. Cherepanov , B. Voigtländer , F. S. Tautz

We review recent efforts to detect small numbers of nuclear spins using magnetic resonance force microscopy. Magnetic resonance force microscopy (MRFM) is a scanning probe technique that relies on the mechanical measurement of the weak…

Mesoscale and Nanoscale Physics · Physics 2010-08-03 M. Poggio , C. L. Degen

Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar…

Scanning probe microscopy (SPM) is ubiquitous in nanoscale science allowing the observation of features in real space down to the angstrom resolution. The scanning nature of SPM, wherein a sharp tip rasters the surface during which a…

Instrumentation and Detectors · Physics 2024-11-20 Maxime Le Ster , Sławomir Pawłowski , Iaroslav Lutsyk , Paweł Janusz Kowalczyk

Piezoresponse Force Microscopy contrast in transversally isotropic material corresponding to the case of c+ - c- domains in tetragonal ferroelectrics is analyzed using Green's function theory by Felten et al. [J. Appl. Phys. 96, 563…

Materials Science · Physics 2009-11-11 Sergei V. Kalinin , Eugene A. Eliseev , Anna N. Morozovska

Since the dawn of scanning probe microscopy (SPM), tapping or intermittent contact mode has been one of the most widely used imaging modes. Manual optimization of tapping mode not only takes a lot of instrument and operator time, but also…

Scanning probe microscopy (SPM) is a valuable technique by which one can investigate the physical characteristics of the surfaces of materials. However, its widespread use is hampered by the time-consuming nature of running an experiment…

Instrumentation and Detectors · Physics 2025-09-03 Nicholas J. Sullivan , Julio J. Valdés , Kirk H. Bevan , Peter Grutter

While piezoelectrics and ferroelectrics are playing a key role in many everyday applications, there are still a number of open questions related to the physics of those materials. In order to foster the understanding of piezoelectrics and…

Materials Science · Physics 2017-12-01 Andres Gomez , Marti Gich , Adrien Carretero-Genevrier , Teresa Puig , Xavier Obradors

A novel scanning probe technique is presented: Scanning microSQUID Force microscopy (SSFM). The instrument features independent topographic and magnetic imaging. The SSFM operates in a dilution refrigerator in cryogenic vacuum. Sample and…

Superconductivity · Physics 2007-05-23 C. Veauvy , D. Mailly , K. Hasselbach

Hafnium oxide (HfO2)-based ferroelectrics offer remarkable promise for memory and logic devices in view of their compatibility with traditional silicon CMOS technology, high switchable polarization, good endurance and thickness scalability.…

Applied Physics · Physics 2020-04-29 Liam Collins , Umberto Celano

We experimentally investigated the contrast mechanism of infrared photoinduced force microscopy (PiFM) for recording vibrational resonances. Extensive experiments have demonstrated that spectroscopic contrast in PiFM is mediated by…

Instrumentation and Detectors · Physics 2020-12-02 Mohammad A. Almajhadi , Syed Mohammad Ashab Uddin , H. Kumar Wickramasinghe

Electrochemical strains are a ubiquitous feature of solid state ionic devices ranging from ion batteries and fuel cells to electroresistive and memristive memories. Recently, we proposed a scanning probe microscopy (SPM) based approach,…

Materials Science · Physics 2015-06-03 A. N. Morozovska , E. A. Eliseev , S. V. Kalinin

Scanning Kelvin probe microscopy (SKPM) is a powerful technique for macroscopic imaging of the electrostatic potential above a surface. Though most often used to image work-function variations of conductive surfaces, it can also be used to…

Applied Physics · Physics 2025-06-10 Isaac C. D. Lenton , Felix Pertl , Lubuna Shafeek , Scott R. Waitukaitis
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