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A home made DSP-controlled scanning probe microscope (SPM) system has been developed and its utilization as a tool for lithography on nanometer scale is reported. User-friendly graphic interface allows to directly perform nanolithography…

Materials Science · Physics 2007-05-23 Pasqualantonio Pingue , Paolo Baschieri , Cesare Ascoli , Michel Dayez

We theoretically demonstrate the ability of electron beams to probe the nonlinear photonic response with nanometer spatial resolution, well beyond the capabilities of existing optical techniques. Although the interaction of electron beams…

Mesoscale and Nanoscale Physics · Physics 2020-12-30 Andrea Konečná , Valerio Di Giulio , Vahagn Mkhitaryan , Claus Ropers , F. Javier García de Abajo

Stepped well-ordered semiconductor surfaces are important as nanotemplates for the fabrication of one-dimensional nanostructures which are candidates of intriguing electronic properties. Therefore a detailed understanding of the underlying…

Mesoscale and Nanoscale Physics · Physics 2017-11-08 Carmen P érez León , Holger Drees , Stefan Martin Wippermann , Michael Marz , Regina Hoffmann-Vogel

Atomic force spectroscopy and microscopy (AFM) are invaluable tools to characterize nanostructures and biological systems. Most experiments, including state-of-the-art images of molecular bonds, are achieved by driving probes at their…

Perceiving nanoscale ferroelectric phenomena from real space is of great importance for elucidating underlying ferroelectric physics. During the past decades, nanoscale ferroelectric characterization has mainly relied on the Piezoresponse…

Materials Science · Physics 2021-10-22 Qibin Zeng , Qicheng Huang , Hongli Wang , Caiwen Li , Zhen Fan , Deyang Chen , Yuan Cheng , Kaiyang Zeng

Sum-frequency generation (SFG) is a powerful second-order nonlinear spectroscopic technique that provides detailed insights into molecular structures and absolute orientations at surfaces and interfaces. However, conventional SFG based on…

Scanning probe microscopy (SPM) is a powerful technique for mapping nanoscale surface properties through tip-sample interactions. Thermal scanning-probe lithography (tSPL) is an advanced SPM variant that uses a silicon tip on a heated…

Atomic Force Microscopy (AFM) has become established as a powerful and a versatile tool for investigating local mechanical properties. In addition, it has been made possible to take advantage of the AFM tip-sample interaction, to perturb,…

A method for the separation and quantitative characterization of the electrostatic and Van der Waals contribution to tip-sample interaction in non-contact Scanning Force Microscopy is presented. It is based on the simultaneous measurement…

Materials Science · Physics 2007-11-06 Elisa Palacios-Lidon , Jaime Colchero

Combinatorial spread libraries offer a unique approach to explore evolution of materials properties over the broad concentration, temperature, and growth parameter spaces. However, the traditional limitation of this approach is the…

Scanning transmission X-ray microscopy (STXM) is a nanoscale imaging technique that can utilize several powerful contrast mechanisms for the quantitative mapping of chemical and physical materials properties. Spatial resolutions down to…

Instrumentation and Detectors · Physics 2026-05-27 Simone Finizio , Benjamin Watts , Benedikt Rösner , Tim A. Butcher , Sebastian Wintz , Markus Weigand , Jörg Raabe

Scanning tunneling microscopy (STM) and micro-electromechanical systems (MEMS) have traditionally addressed vastly different length scales - one resolving atoms, the other engineering macroscopic motion. Here we unite these two fields to…

Mesoscale and Nanoscale Physics · Physics 2026-01-09 R. J. G. Elbertse , M. Xu , A. Keşkekler , S. Otte , R. A. Norte

Photoinduced force microscopy (PiFM) enables nanoscale visualization of optical responses by directly detecting photoinduced forces without relying on luminescence. In molecular assemblies, intermolecular polarization coupling can generate…

Optics · Physics 2026-05-21 Masayoshi Fujii , Mamoru Tamura , Hidemasa Yamane , Hajime Ishihara

Ptychography has become prominent at synchrotron facilities worldwide for characterizing biological and material specimens' topological structures and properties at the nanometer or atomic scale, due to its lens - less, highly quantitative…

Image and Video Processing · Electrical Eng. & Systems 2025-01-28 Tao Liu , Bingyang Wang , JiangTao Zhao , Maik Kahnt , Fucai Zhang

Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to measure electric potential on surfaces at nanometer length scales. Here we demonstrate that Heterodyne-KPFM enables scan rates of several frames per minute in air,…

Mesoscale and Nanoscale Physics · Physics 2016-06-22 Joseph L. Garrett , Jeremy N. Munday

Combination of local heating and biasing at the tip-surface junction in temperature-assisted piezoresponse force microscopy (tPFM) opens the pathway for probing local temperature induced phase transitions in ferroics, exploring the…

Materials Science · Physics 2022-01-21 Anna N. Morozovska , Eugene A. Eliseev , Kyle Kelley , Sergei V. Kalinin

We present a full analysis of the contrast mechanisms for the detection of ferroelectric domains on all faces of bulk single crystals using scanning force microscopy exemplified on hexagonally poled lithium niobate. The domain contrast can…

Materials Science · Physics 2009-11-13 T. Jungk , A. Hoffmann , E. Soergel

Physics-driven discovery in an autonomous experiment has emerged as a dream application of machine learning in physical sciences. Here we develop and experimentally implement a deep kernel learning workflow combining the correlative…

Materials Science · Physics 2022-11-24 Kevin M. Roccapriore , Sergei V. Kalinin , Maxim Ziatdinov

Scanning tunnelling microscopy (STM) is a powerful technique for imaging surfaces with atomic resolution, providing insight into physical and chemical processes at the level of single atoms and molecules. A regular task of STM image…

Fourier ptychographic microscopy (FPM) is a recently proposed computational imaging technique with both high resolution and wide field-of-view. In current FP experimental setup, the dark-field images with high-angle illuminations are easily…

Computer Vision and Pattern Recognition · Computer Science 2017-12-19 Yan Zhang , An Pan , Ming Lei , Baoli Yao
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