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We demonstrate a method for synthesizing large scale single layer graphene by thermal annealing of ruthenium single crystal containing carbon. Low energy electron diffraction indicates the graphene grows to as large as millimeter dimensions…

Materials Science · Physics 2007-09-19 Y. Pan , N. Jiang , J. T. Sun , D. X. Shi , S. X. Du , Feng Liu , H. -J. Gao

Graphene layers were created on both C and Si faces of semi-insulating, on-axis, 4H- and 6H-SiC substrates. The process was performed under high vacuum (<10-4 mbar) in a commercial chemical vapor deposition SiC reactor. A method for H2…

Monolayer graphene has been grown on crystallized Cu (111) films on standard oxidized Si 100 mm wafers. The monolayer graphene demonstrates high uniformity (>97% coverage), with immeasurable defects (>95% defect-negligible) across the…

We demonstrate that it is possible to mechanically exfoliate graphene under ultra high vacuum conditions on the atomically well defined surface of single crystalline silicon. The flakes are several hundred nanometers in lateral size and…

Materials Science · Physics 2015-06-05 O. Ochedowski , G. Begall , N. Scheuschner , M. El Kharrazi , J. Maultzsch , M. Schleberger

Non-conventional epitaxial techniques, such as van der Waals epitaxy (vdWE) and remote epitaxy, have attracted substantial attention in the semiconductor research community for their capability to repeatedly produce high-quality…

The fundamental properties of graphene are making it an attractive material for a wide variety of applications. Various techniques have been developed to produce graphene and recently we discovered the synthesis of large area graphene by…

We report the synthesis of single and bi layer graphene films by low pressure chemical vapor deposition technique on Cu and Au substrates. The as grown films were characterized by transmission electron microscopy, scanning electron…

Materials Science · Physics 2021-09-06 Ch. Ravi Prakash Patel , K. Awasthi , Thaur Prasad Yadav

The morphology of graphene formed on the (000-1) surface (the C-face) and the (0001) surface (the Si-face) of SiC, by annealing in ultra-high vacuum or in an argon environment, is studied by atomic force microscopy and low-energy electron…

Materials Science · Physics 2015-05-20 Luxmi , N. Srivastava , Guowei He , R. M. Feenstra

The evolution in the surface morphology of epitaxial graphene films and 6H-SiC(0001) substrates is studied by electron channeling contrast imaging. Whereas film thickness is determined by growth temperature only, increasing growth times at…

Materials Science · Physics 2009-11-13 Nicola Ferralis , Jason Kawasaki , Roya Maboudian , Carlo Carraro

Low-energy electron microscopy (LEEM) was used to measure the reflectivity of low-energy electrons from graphitized SiC(0001). The reflectivity shows distinct quantized oscillations as a function of the electron energy and graphite…

Materials Science · Physics 2009-11-13 H. Hibino , H. Kageshima , F. Maeda , M. Nagase , Y. Kobayashi , H. Yamaguchi

Graphitization of the 6H-SiC(0001) surface as a function of annealing temperature has been studied by ARPES, high resolution XPS, and LEED. For the initial stage of graphitization - the 6root3 reconstructed surface - we observe sigma-bands…

Materials Science · Physics 2007-05-23 K. V. Emtsev , Th. Seyller , F. Speck , L. Ley , P. Stojanov , J. D. Riley , R. G. C. Leckey

Classical molecular-dynamics simulations were carried out to study epitaxial growth of graphene on 6H-SiC(0001) substrate. It was found that there exists a threshold annealing temperature above which we observe formation of graphitic…

Mesoscale and Nanoscale Physics · Physics 2012-02-23 N. Jakse , R. Arifin , S. K. Lai

Depth profiling of graphene with high-resolution ion beam analysis is a practical method for analysis of monolayer thicknesses of graphene. Not only is the energy resolution sufficient to resolve graphene from underlying SiC, but by use of…

Materials Science · Physics 2011-08-11 M. Copel , S. Oida , A. Kasry , A. A. Bol , J. B. Hannon , R. M. Tromp

We demonstrate a technique to produce thin graphene layers on C-face of SiC under ultra high vacuum conditions. A stack of two SiC substrates comprising a half open cavity at the interface is used to partially confine the depleted Si atoms…

Materials Science · Physics 2013-04-23 C. Celebi , C. Yanik , A. G. Demirkol , Ismet I. Kaya

We report graphene films composed mostly of one or two layers of graphene grown by controlled carbon precipitation on the surface of polycrystalline Ni thin films during atmospheric chemical vapor deposition(CVD). Controlling both the…

Among the many anticipated applications of graphene, some - such as transistors for Si microelectronics - would greatly benefit from the possibility to deposit graphene directly on a semiconductor grown on a Si wafer. We report that Ge(001)…

With expanding interest in graphene-based electronics, it is crucial that high quality graphene films be grown. Sublimation of Si from the 4H-SiC(0001) Si-terminated) surface in ultrahigh vacuum is a demonstrated method to produce epitaxial…

Materials Science · Physics 2009-11-11 J. Hass , C. A. Jeffrey , R. Feng , T. Li , X. Li , Z. Song , C. Berger , W. A. de Heer , P. N. First , E. H. Conrad

The adoption of graphene in electronics, optoelectronics and photonics is hindered by the difficulty in obtaining high quality material on technologically-relevant substrates, over wafer-scale sizes and with metal contamination levels…

Steeping interest on graphene research in basic sciences and applications emphasizes the need for an economical means of synthesizing it. We report a method for the synthesis of graphene on commercially available stainless steel foils using…

Mesoscale and Nanoscale Physics · Physics 2011-09-22 Robin John , A Ashokreddy , C Vijayan , T Pradeep

We have determined the growth mode of graphene on SiC(0001) and SiC(000-1) using ultra-thin, isotopically-labeled Si13C `marker layers' grown epitaxially on the Si12C surfaces. Few-layer graphene overlayers were formed via thermal…

Materials Science · Physics 2011-08-15 J. B. Hannon , M. Copel , R. M. Tromp