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The evolution of the scanning modules for scanning transmission electron microscopes (STEM) has realized the possibility to generate arbitrary scan pathways, an approach currently explored to improve acquisition speed and to reduce electron…

Sample thickness is an important parameter in transmission electron microscopy (TEM) imaging, for interpreting image contrast and understanding the relationship between properties and microstructure. In this study, we introduce a method for…

Materials Science · Physics 2021-11-15 Pengfei Nan , Zhiyao Liang , Yue Zhang , Yangrui Liu , Dongsheng Song , Binghui Ge

Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the…

In this study, we have used a Zr-Nb alloy containing well-defined nano-precipitates as a model material in which to study imaging contrast inversions (atomic number or diffraction contrast) observed with the forescattered electron imaging…

The Segment Anything Model (SAM) is a foundation model for general image segmentation. Although it exhibits impressive performance predominantly on natural images, understanding its robustness against various image perturbations and domains…

Computer Vision and Pattern Recognition · Computer Science 2023-05-25 Yuqing Wang , Yun Zhao , Linda Petzold

Ptychography provides highly efficient imaging in scanning transmission electron microscopy (STEM), but questions have remained over its applicability to strongly scattering samples such as those most commonly seen in materialsscience.…

Applied Physics · Physics 2022-09-07 C. Gao , C. Hofer , D. Jannis , A. Béché , J. Verbeeck , T. J. Pennycook

Cells are the fundamental unit of biological organization, and identifying them in imaging data - cell segmentation - is a critical task for various cellular imaging experiments. While deep learning methods have led to substantial progress…

Using diffusion models to solve inverse problems is a growing field of research. Current methods assume the degradation to be known and provide impressive results in terms of restoration quality and diversity. In this work, we leverage the…

Computer Vision and Pattern Recognition · Computer Science 2025-06-02 Charles Laroche , Andrés Almansa , Eva Coupete

We introduce a machine learning approach to determine the transition dynamics of silicon atoms on a single layer of carbon atoms, when stimulated by the electron beam of a scanning transmission electron microscope (STEM). Our method is…

The three scanning electron microscope diffraction based techniques of electron channelling patterns (ECPs), electron channelling contrast imaging (ECCI), and electron back scatter diffraction (EBSD) are reviewed. The dynamical diffraction…

Materials Science · Physics 2019-04-12 AJ Wilkinson , PB Hirsch

The Segment Anything Model (SAM) exhibits a capability to segment a wide array of objects in natural images, serving as a versatile perceptual tool for various downstream image segmentation tasks. In contrast, medical image segmentation…

Computer Vision and Pattern Recognition · Computer Science 2023-08-29 Yizhe Zhang , Tao Zhou , Shuo Wang , Ye Wu , Pengfei Gu , Danny Z. Chen

Modeling environmental ecosystems is essential for effective resource management, sustainable development, and understanding complex ecological processes. However, traditional methods frequently struggle with the inherent complexity,…

Machine Learning · Computer Science 2025-03-06 Runlong Yu , Shengyu Chen , Yiqun Xie , Xiaowei Jia

The nanoparticle size and distribution information in the SEM images of silicon crystals are generally counted by manual methods. The realization of automatic machine recognition is significant in materials science. This paper proposed a…

Computer Vision and Pattern Recognition · Computer Science 2022-06-07 Ruiling Xiao , Jiayang Niu

In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…

In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion commonly causes blur and distortions in the SEM images.…

Instrumentation and Detectors · Physics 2010-08-09 Petr Cizmar , Andras E. Vladar , Michael T. Postek

Cryo-electron microscopy (cryo-EM) remains pivotal in structural biology, yet the task of protein particle picking, integral for 3D protein structure construction, is laden with manual inefficiencies. While recent AI tools such as Topaz and…

Computer Vision and Pattern Recognition · Computer Science 2023-11-29 Fei He , Zhiyuan Yang , Mingyue Gao , Biplab Poudel , Newgin Sam Ebin Sam Dhas , Rajan Gyawali , Ashwin Dhakal , Jianlin Cheng , Dong Xu

The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…

By their very nature microscopy images of cells and tissues consist of a limited number of object types or components. In contrast to most natural scenes, the composition is known a priori. Decomposing biological images into semantically…

Computer Vision and Pattern Recognition · Computer Science 2019-09-04 Avelino Javer , Jens Rittscher

Recently, developing unified medical image segmentation models gains increasing attention, especially with the advent of the Segment Anything Model (SAM). SAM has shown promising binary segmentation performance in natural domains, however,…

Computer Vision and Pattern Recognition · Computer Science 2024-12-18 Shuangping Huang , Hao Liang , Qingfeng Wang , Chulong Zhong , Zijian Zhou , Miaojing Shi

The research and development cycle of advanced manufacturing processes traditionally requires a large investment of time and resources. Experiments can be expensive and are hence conducted on relatively small scales. This poses problems for…

Computer Vision and Pattern Recognition · Computer Science 2023-02-17 Scott Howland , Lara Kassab , Keerti Kappagantula , Henry Kvinge , Tegan Emerson
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