Related papers: Feedforward Compensation of Piezo Nonlinearity for…
Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…
We adjust the transient dynamics of a piezo-actuated bimorph Atomic Force Microscopy (AFM) probe using a state feedback controller. This approach enables us to adjust the quality factor and the resonance frequency of the probe…
In this paper, a frequency separation based adaptive feedforward control algorithm is developed with the ability to identify the plant and do compensation region by region. In this algorithm, the accelerometer signal is filtered by a series…
Piezoresponse force microscopy (PFM) has established itself as a very successful and reliable imaging and spectroscopic tool for measuring a wide variety of nanoscale electromechanical functionalities. Quantitative imaging of nanoscale…
Coupling between electrical and mechanical phenomena is a near-universal characteristic of inorganic and biological systems alike, with examples ranging from ferroelectric perovskites to electromotor proteins in cellular membranes.…
Optical nanoscopy is crucial in life and materials sciences, revealing subtle cellular processes and nanomaterial properties. Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) provides nanoscale resolution, relying on the…
Atomic Force Microscopy (AFM) enables high-resolution surface imaging at the nanoscale, yet the output is often degraded by artifacts introduced by environmental noise, scanning imperfections, and tip-sample interactions. To address this…
Atomic Force Microscopy (AFM) is a suitable tool to perform tribological characterization of materials down to the nanometer scale. An important aspect in nanofriction measurements of corrugated samples is the local tilt of the surface,…
As mechanical devices in the nano/micro length scale are increasingly employed, it is crucial to understand nanoscale friction and wear especially at technically relevant sliding velocities. Accordingly, a novel technique has been developed…
Autofocus (AF) methods are extensively used in biomicroscopy, for example to acquire timelapses, where the imaged objects tend to drift out of focus. AD algorithms determine an optimal distance by which to move the sample back into the…
Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate ferroelectrics domains. PFM gives insight into the strength of local piezoelectric coupling as well as polarization direction…
To achieve quantitative interpretation of Piezoresponse Force Microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, analytical representations for tip-induced electroelastic fields inside…
A nanometric needle sensor mounted in an Atomic Force Microscopy allows systematic picometer-range distance measurements. This force sensing device is used in Piezoresponse Force Microscopy (PFM) as a distance sensor, by employing the…
The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These…
Pseudo-heterodyne scattering-type scanning near-field optical microscopy (sSNOM) is applied in the mid-infrared region to detect the chemical composition of biomolecules on the nanoscale. However, the application of sSNOM in molecular…
Piezoresponse force microscopy (PFM) is a powerful tool widely used to characterize piezoelectricity and ferroelectricity at the nanoscale. However, it is necessary to distinguish microscopic mechanisms between piezoelectricity and…
Objective: The study aims to address the challenge of aligning Standard Fundus Images (SFIs) and Ultra-Widefield Fundus Images (UWFIs), which is difficult due to their substantial differences in viewing range and the amorphous appearance of…
Optical aberrations prevent telescopes from reaching their theoretical diffraction limit. Once estimated, these aberrations can be compensated for using deformable mirrors in a closed loop. Focal plane wavefront sensing enables the…
This paper studies analog beamforming in active sensing applications, such as millimeter-wave radar or ultrasound imaging. Analog beamforming architectures employ a single RF-IF chain connected to all array elements via inexpensive phase…
We propose the feed-forward perturbation-based nonlinearity compensation method using the received signal, which outperforms conventional decision-based ones and eliminates the need for decision feedback. Additionally, combining half-half…