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The future large adaptive telescopes will trigger new constraints for the calibration of Adaptive Optics (AO) systems equipped with pre-focal Deformable Mirrors (DM). The image of the DM actuators grid as seen by the Wave-Front Sensor (WFS)…
Tilt-corrected imaging methods in four-dimensional scanning transmission electron microscopy (4D-STEM) have recently emerged as a new class of direct ptychography methods that are especially useful at low dose. The operation of tilt…
A fully digital beam position and phase measurement (BPPM) system was designed for the linear accelerator (LINAC) in Accelerator Driven Sub-critical System (ADS) in China. Phase information is obtained from the summed signals from four…
Phasor Measurement Units (PMUs) convert high-speed waveform data into low-speed phasor data, which are fundamental to wide-area monitoring and control in power systems, with oscillation detection and localization among their most prominent…
Deformable image registration is a fundamental task in medical imaging. Due to the large computational complexity of deformable registration of volumetric images, conventional iterative methods usually face the tradeoff between the…
Vision Foundation Models (VFMs) extract spatially downsampled representations, posing challenges for pixel-level tasks. Existing upsampling approaches face a fundamental trade-off: classical filters are fast and broadly applicable but rely…
The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…
This paper proposes a new technique based on nonlinear Adaptive Median filter (AMF) for image restoration. Image denoising is a common procedure in digital image processing aiming at the removal of noise, which may corrupt an image during…
Fast Fourier Transform based phase screen simulations give accurate results only when the screen size ($G$) is much larger than the outer scale parameter ($L_0$). Otherwise, they fall short in correctly predicting both the low and high…
Diffusion models have marked a significant breakthrough in the synthesis of semantically coherent images. However, their extensive noise estimation networks and the iterative generation process limit their wider application, particularly on…
We present a new method to achieve high-contrast images using segmented and/or on-axis telescopes. Our approach relies on using two sequential Deformable Mirrors to compensate for the large amplitude excursions in the telescope aperture due…
Quartz tuning fork-based atomic force microscopy (QTF-AFM) has become a powerful tool for high-resolution imaging of both conductive and insulating samples, including semiconductor structures and metal-coated surfaces as well as soft matter…
Scalar diffraction calculations such as the angular spectrum method (ASM) and Fresnel diffraction, are widely used in the research fields of optics, X-rays, electron beams, and ultrasonics. It is possible to accelerate the calculation using…
Atomic force microscopy (AFM) is a versatile nanoscale imaging technique. Since its spatiotemporal resolution is fundamentally limited by the minimum detectable force (MDF) arising from system noise, a deep understanding of MDF is essential…
Photoacoustic imaging (PAI) is a promising medical imaging modality providing the spatial resolution of ultrasound (US) imaging and the contrast of pure optical imaging. For linear-array PAI, a beamformer has to be used as the…
The native structures of proteins, except for notable exceptions of intrinsically disordered proteins, in general take their most stable conformation in the physiological condition to maintain their structural framework so that their…
Well-ordered stepped semiconductor surfaces attract intense attention owing to the regular arrangements of their atomic steps that makes them perfect templates for the growth of one- dimensional systems, e.g. nanowires. Here, we report on…
Atomic-resolution imaging on molten metal/solid interfaces at temperatures above 200 {\deg}C was achieved using a high-temperature, high-speed atomic force microscope (AFM) equipped with a qPlus sensor. A tip-scanning high-speed Quadpod…
Qubit measurements in quantum devices involve various types of errors, including erroneous state determination, correlated preparation errors and measurement-induced leakage from the computational states. We propose a feedforward protocol…
Interatomic-force measurements are regularly performed using frequency-modulation atomic force microscopy. This requires conversion of the observed shift in the resonant frequency of a force-sensing cantilever, to the actual force…