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In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…

Utilizing Convolutional Neural Networks (CNNs), Recurrent Neural Networks (RNNs), and Generative Adversarial Networks (GANs), our system introduces an innovative approach to defect detection in manufacturing. This technology excels in…

Additive Manufacturing (AM) is transforming the manufacturing sector by enabling efficient production of intricately designed products and small-batch components. However, metal parts produced via AM can include flaws that cause inferior…

Visual inspection for defect grading in agricultural supply chains is crucial but traditionally labor-intensive and error-prone. Automated computer vision methods typically require extensively annotated datasets, which are often unavailable…

From a process development perspective, diamond growth via chemical vapor deposition has made significant strides. However, challenges persist in achieving high quality and large-area material production. These difficulties include…

Effectively addressing the challenge of industrial Anomaly Detection (AD) necessitates an ample supply of defective samples, a constraint often hindered by their scarcity in industrial contexts. This paper introduces a novel algorithm…

Here, we develop a framework for the prediction and screening of native defects and functional impurities in a chemical space of Group IV, III-V, and II-VI zinc blende (ZB) semiconductors, powered by crystal Graph-based Neural Networks…

Automatic visual inspection using machine learning plays a key role in achieving zero-defect policies in industry. Research on anomaly detection is constrained by the availability of datasets that capture complex defect appearances and…

The development of computer vision and in-situ monitoring using visual sensors allows the collection of large datasets from the additive manufacturing (AM) process. Such datasets could be used with machine learning techniques to improve the…

In this research, we introduce a unified end-to-end Automated Defect Classification-Detection-Segmentation (ADCDS) framework for classifying, detecting, and segmenting multiple instances of semiconductor defects for advanced nodes. This…

This paper presents an IoT-enhanced deep learning framework for automated crack detection in Additive Manufacturing (AM) surfaces using convolutional neural networks (CNNs). By integrating IoT-enabled real-time monitoring, high-resolution…

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely…

Large-scale data collection is essential for developing personalized training data, mitigating the shortage of training data, and fine-tuning specialized models. However, creating high-quality datasets quickly and accurately remains a…

Artifact detectors have been shown to enhance the performance of image-generative models by serving as reward models during fine-tuning. These detectors enable the generative model to improve overall output fidelity and aesthetics. However,…

We present a novel large-scale dataset for defect detection in a logistics setting. Recent work on industrial anomaly detection has primarily focused on manufacturing scenarios with highly controlled poses and a limited number of object…

Image segmentation is fundamental to microstructural analysis for defect identification and structure-property correlation, yet remains challenging due to pronounced heterogeneity in materials images arising from varied processing and…

Training supervised deep neural networks that perform defect detection and segmentation requires large-scale fully-annotated datasets, which can be hard or even impossible to obtain in industrial environments. Generative AI offers…

Currently, industrial anomaly detection suffers from two bottlenecks: (i) the rarity of real-world defect images and (ii) the opacity of sample quality when synthetic data are used. Existing synthetic strategies (e.g., cut-and-paste)…

In the journey of computer vision system development, the acquisition and utilization of annotated images play a central role, providing information about object identity, spatial extent, and viewpoint in depicted scenes. However, thermal…

Learning from imperfect data becomes an issue in many industrial applications after the research community has made profound progress in supervised learning from perfectly annotated datasets. The purpose of the Learning from Imperfect Data…