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Shearography is an interferometric technique sensitive to surface displacement gradients, providing high sensitivity for detecting subsurface defects in safety-critical components. A key limitation to industrial adoption is the lack of…

Computer Vision and Pattern Recognition · Computer Science 2026-04-24 Jessica Plassmann , Nicolas Schuler , Michael Schuth , Georg von Freymann

In industrial settings, surface defects on steel can significantly compromise its service life and elevate potential safety risks. Traditional defect detection methods predominantly rely on manual inspection, which suffers from low…

Machine Learning · Computer Science 2025-04-25 Cheng Shen , Yuewei Liu

To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the…

Computer Vision and Pattern Recognition · Computer Science 2019-01-25 Weibo Huang , Peng Wei

Industrial X-ray analysis is common in aerospace, automotive or nuclear industries where structural integrity of some parts needs to be guaranteed. However, the interpretation of radiographic images is sometimes difficult and may lead to…

Computer Vision and Pattern Recognition · Computer Science 2022-09-07 Alberto García-Pérez , María José Gómez-Silva , Arturo de la Escalera

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

Computer Vision and Pattern Recognition · Computer Science 2023-08-21 Thibault Lechien , Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Sandip Halder , Stefan De Gendt , Wannes Meert

The goal of this work is to propose a robust, fast, and fully automatic method for personalized cranial defect reconstruction and implant modeling. We propose a two-step deep learning-based method using a modified U-Net architecture to…

Image and Video Processing · Electrical Eng. & Systems 2022-04-14 Marek Wodzinski , Mateusz Daniol , Miroslaw Socha , Daria Hemmerling , Maciej Stanuch , Andrzej Skalski

The bottleneck in learning-based industrial defect detection is often limited not by model capacity, but by the scarcity of labeled defect data: defects are rare, annotations are expensive, and collecting balanced training sets is slow. We…

Computer Vision and Pattern Recognition · Computer Science 2026-04-30 Paul Julius Kühn , Mika Pommeranz , Arjan Kuijper , Saptarshi Neil Sinha

Efficient automated print defect mapping is valuable to the printing industry since such defects directly influence customer-perceived printer quality and manually mapping them is cost-ineffective. Conventional methods consist of…

Computer Vision and Pattern Recognition · Computer Science 2020-01-29 Augusto C. Valente , Cristina Wada , Deangela Neves , Deangeli Neves , Fábio V. M. Perez , Guilherme A. S. Megeto , Marcos H. Cascone , Otavio Gomes , Qian Lin

In industry, defect detection is crucial for quality control. Non-destructive testing (NDT) methods are preferred as they do not influence the functionality of the object while inspecting. Automated data evaluation for automated defect…

Computer Vision and Pattern Recognition · Computer Science 2026-02-06 Natascha Jeziorski , Petra Gospodnetić , Claudia Redenbach

The ability to segment unknown objects in depth images has potential to enhance robot skills in grasping and object tracking. Recent computer vision research has demonstrated that Mask R-CNN can be trained to segment specific categories of…

Computer Vision and Pattern Recognition · Computer Science 2019-03-05 Michael Danielczuk , Matthew Matl , Saurabh Gupta , Andrew Li , Andrew Lee , Jeffrey Mahler , Ken Goldberg

A critical aspect in the manufacturing process is the visual quality inspection of manufactured components for defects and flaws. Human-only visual inspection can be very time-consuming and laborious, and is a significant bottleneck…

Computer Vision and Pattern Recognition · Computer Science 2021-11-30 Mohammad Javad Shafiee , Mahmoud Famouri , Gautam Bathla , Francis Li , Alexander Wong

Numerous image processing techniques (IPTs) have been employed to detect crack defects, offering an alternative to human-conducted onsite inspections. These IPTs manipulate images to extract defect features, particularly cracks in surfaces…

Computer Vision and Pattern Recognition · Computer Science 2024-12-06 Mohsen Asghari Ilani , Leila Amini , Hossein Karimi , Maryam Shavali Kuhshuri

Light guide plates are essential optical components widely used in a diverse range of applications ranging from medical lighting fixtures to back-lit TV displays. An essential step in the manufacturing of light guide plates is the quality…

Image and Video Processing · Electrical Eng. & Systems 2022-04-26 Carol Xu , Mahmoud Famouri , Gautam Bathla , Mohammad Javad Shafiee , Alexander Wong

This paper presents an AI-assisted auto-labeling system for display panel defect detection that leverages in-context learning capabilities. We adopt and enhance the SegGPT architecture with several domain-specific training techniques and…

Computer Vision and Pattern Recognition · Computer Science 2025-06-06 Babar Hussain , Qiang Liu , Gang Chen , Bihai She , Dahai Yu

Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects.…

Computer Vision and Pattern Recognition · Computer Science 2024-07-18 Amit Prasad , Bappaditya Dey , Victor Blanco , Sandip Halder

Deep-learning methods have recently started being employed for addressing surface-defect detection problems in industrial quality control. However, with a large amount of data needed for learning, often requiring high-precision labels, many…

Computer Vision and Pattern Recognition · Computer Science 2021-04-21 Jakob Božič , Domen Tabernik , Danijel Skočaj

Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible detection of defect patterns allows quality control and…

Machine Learning · Computer Science 2024-06-11 Tobias Schlosser , Frederik Beuth , Michael Friedrich , Danny Kowerko

Utility companies increasingly rely on drone imagery for post-event and routine inspection, but training accurate defect-type classifiers remains difficult because defect examples are rare and inspection datasets are often limited or…

Computer Vision and Pattern Recognition · Computer Science 2026-03-10 Xuesong Wang , Caisheng Wang

Steel surface defect analysis is critical for industrial quality control, yet existing benchmarks rely primarily on label-only annotations, limiting fine-grained semantic understanding and systematic evaluation of vision-language models. To…

Computer Vision and Pattern Recognition · Computer Science 2026-05-11 Shuxian Zhao , Jie Gui , Baosheng Yu , Dacheng Tao

Deep neural networks have achieved satisfactory performance in piles of medical image analysis tasks. However the training of deep neural network requires a large amount of samples with high-quality annotations. In medical image…

Computer Vision and Pattern Recognition · Computer Science 2020-07-08 Jixin Wang , Sanping Zhou , Chaowei Fang , Le Wang , Jinjun Wang