English
Related papers

Related papers: White light interferometry analysis for measuring …

200 papers

A new approach was proposed to accurately determine the thickness of film, especially for ultra-thin film, through spectrum fitting with the assistance of interference layer. The determination limit can reach even less than 1 nm. Its…

Optics · Physics 2016-06-20 Xingxing Liu , Shao-Wei Wang , Hui Xia , Xutao Zhang , Ruonan Ji , Tianxin Li , Wei Lu

Thin film interferometry is a powerful technique for non-invasively measuring liquid film thickness with applications in ophthalmology, but its clinical translation is hindered by the challenges in reconstructing thickness profiles from…

Computer Vision and Pattern Recognition · Computer Science 2025-10-30 Gautam A. Viruthagiri , Arnuv Tandon , Gerald G. Fuller , Vinny Chandran Suja

Diffraction of light beams from the phase steps due to the abrupt changes in the boundary of step leads to Fresnel fringes that their visibility and intensity profile depend on the change of the step height or light incident angle. The…

Instrumentation and Detectors · Physics 2018-12-05 Ali Motazedifard , S. Dehbod , A. Salehpour

A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…

Optics · Physics 2010-06-14 V. Berejnov , D. Li

In this paper, a thin film thickness gauge based on the interferometric principle of Y-shaped optical fiber is proposed to achieve accurate measurement of film thickness. In this paper, the optical fiber, the interferometric principle and…

Dynamic thin film interferometry is a technique used to non-invasively characterize the thickness of thin liquid films. Recovering the underlying thickness from the captured interferograms, unconditionally and automatically is still an open…

White light spectral interferometry is applied to measure the refractive index in absorbing liquids in the spectral range from 400 to 1000 nm. We analyze the influence of absorption on the visibility of interferometric fringes and,…

We describe a high-speed interferometric method, using multiple angles of incidence and multiple wavelengths, to measure the absolute thickness, tilt, the local angle between the surfaces, and the refractive index of a fluctuating…

Optics · Physics 2020-08-26 Mengfei He , Sidney R. Nagel

White-light interferometry is one of today's most precise tools for determining optical material properties. Achievable precision and accuracy are typically limited by systematic errors due to a high number of interdependent data fitting…

We present a simple but effective method to extract the reflectivity spectra from the interference signals with a large NA white light interferometry. Numerical simulations and experiments have demonstrated the effectiveness of our method.…

Optics · Physics 2025-03-11 Cheng Chen , Lixuan Xu , Rong Su

Measuring temperature fields in semi-transparent media requires the knowledge of material thermo-optic properties. While the current techniques are well established for isothermal thin films, they remain unexplored for thick media where…

Applied Physics · Physics 2025-05-02 Jordan Letessier , Abel Netter , Jérémie Maire , Stéphane Chevalier

The Wide-Field Imaging Interferometry Testbed (WIIT) will provide valuable information for the development of space-based interferometers. This laboratory instrument operates at optical wavelengths and provides the ability to test…

When the thickness of the layer is smaller than the electrons mean free path, the morphology affects the conductivity directly based on the layer thickness. This issue provides basis in order to estimate the thickness of the layer by…

Mesoscale and Nanoscale Physics · Physics 2015-06-16 M. Jannesar , G. R. Jafari , S. Vasheghani Farahani , S. Moradi

We propose using THz frequency selective surfaces interrogated with THz subwavelength optical fibers as sensors for monitoring of the optical properties of thick films that are brought in contact with such surfaces. Changes in the test film…

Optics · Physics 2013-11-26 Martin Girard , Maksim Skorobogatiy

We have developed a new technique for photothermal displacement spectroscopy that is potentially orders of magnitude more sensitive than conventional methods. We use a single Fabry-Perot resonator to enhance both the intensity of the pump…

Materials Science · Physics 2009-11-10 Eric D. Black , Ivan S. Grudinin , Shanti R. Rao , Kenneth G. Libbrecht

Despite its ability to draw precise inferences from large and complex datasets, the use of data analytics in the field of condensed matter and materials sciences -- where vast quantities of complex metrology data are regularly generated --…

Applied Physics · Physics 2019-01-31 Davoud Hejazi , Shuangjun Liu , Sarah Ostadabbas , Swastik Kar

The amplification obtained using weak values is quantified through a detailed investigation of the signal to noise ratio for an optical beam deflection measurement. We show that for a given deflection, input power and beam radius, the use…

Quantum Physics · Physics 2009-10-14 David J. Starling , P. Ben Dixon , Andrew N. Jordan , John C. Howell

The detection of spatial or temporal variations in very thin samples has important applications in the biological sciences. For example, cellular membranes exhibit changes in lipid composition and order, which in turn modulate their…

Context: Some stellar objects exhibit very narrow spectral lines in the visible range additional to their blackbody radiation. Natural lasing has been suggested as a mechanism to explain narrow lines in Wolf-Rayet stars. However, the…

Instrumentation and Methods for Astrophysics · Physics 2017-05-26 Peng Kian Tan , Christian Kurtsiefer

A key enabling technology for many liquid noble gas (LNG) detectors is the use of the common wavelength shifting medium tetraphenyl butadiene (TPB). TPB thin films are used to shift ultraviolet scintillation light into the visible spectrum…

Instrumentation and Detectors · Physics 2018-05-09 C. P. Benson , G. D. Orebi Gann , V. M. Gehman
‹ Prev 1 2 3 10 Next ›