Related papers: Separate-scan atomic force microscope for fast inf…
Microscopy is an essential tool in scientific research, enabling the visualization of structures at micro- and nanoscale resolutions. However, the field of microscopy often encounters limitations in field-of-view (FOV), restricting the…
We report our detailed investigation of high-resolution imaging using secondary electrons (SE) with a subnanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire…
Atomic force microscopy (AFM) phase approach-curves have significant potential for nanoscale material characterization, however, the availability of robust datasets and automated analysis tools has been limited. In this paper, we introduce…
A major challenge in Atomic Force Microscopy (AFM) is to reduce the scan duration while retaining the image quality. Conventionally, the scan rate is restricted to a sufficiently small value in order to ensure a desirable image quality as…
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron charging events with high spatial resolution, at low…
We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…
We propose a novel method for ultra-sensitive infrared (IR) vibrational spectroscopy of molecules with nanoscale footprints by combining the tip enhancement of the scattering-type scanning near-field optical microscope (s-SNOM) and the…
Plasmonic nanoparticles generate strongly localized and enhanced light field through localized surface plasmon resonance, thereby playing a central role in plasmonics and nanophotonics. Because the optical properties of plasmonic…
Structured illumination microscopy (SIM) is an important super-resolution based microscopy technique that breaks the diffraction limit and enhances optical microscopy systems. With the development of biology and medical engineering, there…
Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of…
High-speed image acquisition in light microscopy is essential for a wide range of applications, including observing dynamic biological processes and enabling high-throughput sample analysis. However, traditional imaging speeds are often…
We describe a novel application of atomic force microscopy (AFM) to directly visualize cytoskeletal fibers in human foreskin epithelial cells. The nonionic detergent Triton X-100 in a low concentration was used to remove the membrane,…
Apertureless scanning near-field optical microscopy (a-SNOM) is typically limited to ~10 nm resolution by the tip apex size. We demonstrate that ~1-nm resolution can be achieved under continuous-wave (CW) illumination by exploiting Fano…
We demonstrate a cryogenic scanned probe microscope (SPM) that has been modified to be controlled with a haptic device, such that the operator can `feel' the surface of a sample under investigation. This system allows for direct tactile…
Super-resolution fluorescence microscopy is of great interest in life science studies for visualizing subcellular structures at the nanometer scale. Among various kinds of super-resolution approaches, image scanning microscopy (ISM) offers…
Scattering scanning near-field optical microscopy enables optical imaging and characterization of plasmonic devices with nanometer-scale resolution well below the diffraction limit. This technique enables developers to probe and understand…
Scanning transmission X-ray microscopy (STXM) is a nanoscale imaging technique that can utilize several powerful contrast mechanisms for the quantitative mapping of chemical and physical materials properties. Spatial resolutions down to…
Atomic Force Microscopy (AFM) is a widely employed tool for micro-/nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete…
Single-molecule detection enables direct observation of individual biomolecular events, providing mechanistic insights into biological processes and offering a powerful tool for disease diagnostics. However, the fundamental scale mismatch…
We developed the models and algorithms to describe two main artefacts of AFM: (i) broadening effect and (ii) decreased heights of profiles for individual objects adsorbed on a hard substrate. It was shown how to measure elastic properties…