Related papers: Imaging artefacts in scattering-type scanning near…
In recent years several methods to overcome diffraction limit in the far field microscopy have been demonstrated. Still the problem of superresolution is reliably solved only for fluorescent microscopy, giving a resolution of up to 20-30nm.…
Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a resolution beyond the optical diffraction limit. However,…
Reflected or scattered light produce artefacts in astronomical observations that can negatively impact the scientific study. Hence, automated detection of these artefacts is highly beneficial, especially with the increasing amounts of data…
Scanning X-ray nanodiffraction microscopy is a powerful technique for spatially resolving nanoscale structural morphologies by diffraction contrast. One of the critical challenges in experimental nanodiffraction data analysis is posed by…
Scattering-type scanning near-field optical microscopy (s-SNOM), and its derivate, Fourier transform infrared nanospectroscopy (nano-FTIR) are emerging techniques for infrared (IR) nanoimaging and spectroscopy with applications in diverse…
Sum-frequency generation (SFG) is a powerful second-order nonlinear spectroscopic technique that provides detailed insights into molecular structures and absolute orientations at surfaces and interfaces. However, conventional SFG based on…
We introduce a scattering-type scanning near-field infrared microscope (s-SNIM) for the local scale near- field sample analysis and spectroscopy from room (RT) down to liquid helium (LHe) temperatures. The extension of s-SNIM down to T = 5K…
Ptychography provides highly efficient imaging in scanning transmission electron microscopy (STEM), but questions have remained over its applicability to strongly scattering samples such as those most commonly seen in materialsscience.…
Image denoising or artefact removal using deep learning is possible in the availability of supervised training dataset acquired in real experiments or synthesized using known noise models. Neither of the conditions can be fulfilled for…
In this study, we investigated the application of the direct sampling method (DSM) to identify small dielectric objects in a limited-aperture inverse scattering problem. Unlike previous studies, we consider the bistatic measurement…
In this paper we consider the application of electromagnetic theory to the analysis of the Scanning Near-field Optical Microscope (SNOM) in order to predict experimentally observable quantities such as the transmission or reflection…
Artifact detection algorithms are crucial to correcting the output generated by diffusion models. However, because of the variety of artifact forms, existing methods require substantial annotated data for training. This requirement limits…
Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and nanoscale resolutions to extract physical knowledge and…
Molecular self-assembly, the function of biomembranes, and the performance of organic solar cells rely on molecular interactions on the nanoscale. The understanding and design of such intrinsic or engineered heterogeneous functional soft…
Incoherently illuminated or luminescent objects give rise to a low-contrast speckle-like pattern when observed through a thin diffusive medium, as such a medium effectively convolves their shape with a speckle-like point spread function…
Our interest has been to study the effect that scattered radiation has on contrast, signal-to-noise ratio and thickness reconstruction in digital mammographies. Using the GEANT code we have performed Monte-Carlo simulations of 25 kVp Mo/Mo…
While scattered light conveys most of the information we perceive, scattering may also distort that information before it reaches our detectors. The problem is acute in many applications, such as in high-resolution microscopy of biological…
This manuscript demonstrates the theory, design, and simulation of scattering scanning near field microscopy (s-SNOM) in 0.5THz. A comprehensive simulation model of nanotips' geometry, sample materials, and incident field is established to…
Phonons diffraction and interference patterns are observed at the atomic scale, using molecular dynamics simulations in systems containing crystalline silicon and nanometric obstacles as voids or amorphous-inclusions. The diffraction…
Helium-ion beams (HIB) focused to sub-nanometer scales have emerged as powerful tools for high-resolution imaging as well as nano-scale lithography, ion milling or deposition. Quantifying irradiation effects is essential for reliable device…