Related papers: Imaging artefacts in scattering-type scanning near…
We theoretically study resonance responses of flat surfaces and sharp edges of the nanostructures that support excitations of phonon-polaritons in mid-infrared range. We focus on two materials: silicon carbide that has a nearly isotropic…
Electric field enhancement mediated through sharp tips in scattering-type scanning near-field optical microscopy (s-SNOM) enables optical material analysis down to the 10-nm length scale, and even below. Nevertheless, mostly the…
We analyze how a probing particle modifies the infrared electromagnetic near field of a sample. The particle, described by electric and magnetic polarizabilities, represents the tip of an apertureless scanning optical near-field microscope…
Confined electron systems, such as 2D electron gases (2DEGs), 2D materials, or topological insulators show great technological promise but their susceptibility to defects often results in nanoscale inhomogeneities with unclear origins.…
Ghost imaging leverages a single-pixel detector with no spatial resolution to acquire object echo intensity signals, which are correlated with illumination patterns to reconstruct an image. This architecture inherently mitigates scattering…
Scattering scanning near-field optical microscopy enables optical imaging and characterization of plasmonic devices with nanometer-scale resolution well below the diffraction limit. This technique enables developers to probe and understand…
The optoelectronic properties of nanoscale systems such as carbon nanotubes (CNTs), graphene nanoribbons and transition metal dichalcogenides (TMDCs) are determined by their dielectric function. This complex, frequency dependent function is…
We study the response of a conical metallic surface to an external electromagnetic (EM) field by representing the fields in basis functions containing integrable singularities at the tip of the cone. A fast analytical solution is obtained…
Time-resolved scanning near-field optical microscopy (tr-SNOM) enables the measurement of the dynamic optical response of functional surfaces beyond the diffraction limit. Experimental challenges are imposed both by the use of a pulsed…
The near field scanning optical microscopy (NSOM) is not only a tool for imaging of objects in the sub wavelength limit but also a prominent characteristic tool for understanding the intrinsic properties of the nanostructures. The effect of…
We analyse how a probing particle modifies infrared electromagnetic near fields. The particle, assimilated to both electric and magnetic dipoles, represents the tip of an apertureless scanning optical near-field microscope (SNOM). We show…
Scattering-type scanning near-field optical microscopy (s-SNOM) enables sub-diffraction spectroscopy, featuring high sensitivity to small spatial permittivity variations of the sample surface. However, due to the near-field probe-sample…
Extending super-resolution imaging techniques to objects hidden in strongly scattering media potentially revolutionize the technical analysis for much broader categories of samples, such as biological tissues. The main challenge is the…
The near-field scanning optical microscopic (NSOM) imaging of Au nanoparticles with size in the sub-wavelength limit (<wavelength/2N.A.) is reported. The NSOM imaging technique can resolve the objects which is beyond the scope of optical…
Manufacturing of particulate products across many industries relies on accurate measurements of particle size distributions in dispersions or powders. Laser diffraction (or small angle light scattering) is commonly used, usually off-line,…
Nanoscale forces play an important role in different scanning probe microscopies, most notably atomic force microscopy (AFM). In contrast, in scanning near-field optical microscopy (SNOM) a light-induced coupled local optical polarization…
Non-invasive detection of objects embedded inside an optically scattering medium is essential for numerous applications in engineering and sciences. However, in most applications light at visible or near-infrared wavebands is scattered by…
The experimental limitations in the signal enhancement and spatial resolution in spectroscopic imaging have been always a challenging task in the application of near-field spectroscopy for nanostructured materials in the sub-diffraction…
Near-field optical microscopes with two independent tips for simultaneous excitation and detection can be essential tools for studying localized optical phenomena on the subwavelength scale. Here, we report on the implementation of a fully…
Invisibility cloaks have become one of the most outstanding developments among the wide range of applications in the field of metamaterials. So far, most efforts in invisibility science have been devoted to achieving practically realizable…