Related papers: Localization of nanoscale objects with light singu…
It has been seen recently that when probing a nanoscale object to determine, for example, size or position via light scattering, significant advantage in measurement precision can be gained from exploiting phase singularities in a…
In recent years, there has been a mounting interest in better methods of measuring nanoscale objects, especially in fields such as nanotechnology, biomedicine, cleantech, and microelectronics. Conventional methods have proved insufficient,…
Addressing subwavelength object and displacement is crucial in optical nanometrology. We show in this Letter that nano antennas with subwavelength structures can be addressed precisely by incident beams with singularity. This accurate…
We motivate metrology schemes based on topological singularities as a way to build robustness against deformations of the system. In particular, we relate reference settings of metrological systems to topological singularities in the…
When subjected to monochromatic incident light a nanoparticle will emit light which then interferes with the incident beam. With sufficient contrast and sufficiently close to the particle this interference pattern may be recorded with a…
Light has shown up an incredibe capability in precision measurement based on opto-mechanic interaction in high vacuum by isolating environment noises. However, there are still obstructions, such as displacement and mass estimation error,…
Single-emitter microscopy has emerged as a promising method of imaging nanostructures with nanoscale resolution. This technique uses the centroid position of an emitters far-field radiation pattern to infer its position to a precision that…
We study the fundamental limit on the localization precision for a subwavelength scatterer embedded in a strongly scattering environment, using the external degrees of freedom provided by wavefront shaping. For a weakly scattering target,…
Some new unusual physical phenomena and effects associated with dielectric mesoscale particles with Mie size parameter near 10 were studied and have been discovered during the last decade. In this paper, we propose nanoholes structured…
Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present…
Microscopes and various forms of interferometers have been used for decades in optical metrology of objects that are typically larger than the wavelength of light {\lambda}. However, metrology of subwavelength objects was deemed impossible…
Distinguishing two objects or point sources located closer than the Rayleigh distance is impossible in conventional microscopy. Understandably, the task becomes increasingly harder with a growing number of particles placed in close…
Despite recent tremendous progress in optical imaging and metrology, the resolution gap between atomic scale transmission electron microscopy and optical techniques has not been closed. Is optical imaging and metrology of nanostructures…
A brief overview of the current state of the problem of electromagnetic field singularities arising from the refraction and scattering of light by material objects is given. The discussion begins with caustics arising from ray tracing in…
The development of levitated optomechanics has enabled precise force sensors that operate in the quantum measurement regime, opening up unique opportunities to search for new physics whose weak interactions may have evaded existing sensors.…
We numerically study the expansion dynamics of ultracold atoms in a one-dimensional disordered potential in the presence of a weak position measurement of the atoms. We specifically consider this position measurement to be realized by a…
We experimentally demonstrate a non-imaging approach to displacement measurement for complex scattering materials. By spatially controlling the wave front of the light that incidents on the material we concentrate the scattered light in a…
Controlling quantum light-matter interactions at scales smaller than the diffraction limit at the single quantum emitter level is a critical challenge to the goal of advancing quantum technologies. We introduce a novel material platform…
We demonstrate the measurement of nanoparticle shape by angularly resolved Rayleigh scattering of single optical levitated particles that are oriented in space via the trapping light in vacuum. This technique is applied to a range of…
The scaling behaviour of the diffraction intensity near the origin is investigated for (partially) ordered systems, with an emphasis on illustrative, rigorous results. This is an established method to detect and quantify the fluctuation…