Topological metrology and its application to optical position sensing
Optics
2015-12-10 v2
Abstract
We motivate metrology schemes based on topological singularities as a way to build robustness against deformations of the system. In particular, we relate reference settings of metrological systems to topological singularities in the measurement outputs. As examples we discuss optical nano-position sensing (i) using a balanced photodetector and a quadrant photodetector, and (ii) a more general image based scheme. In both cases the reference setting is a scatterer position that corresponds to a topological singularity in an output space constructed from the scattered field intensity distributions.
Cite
@article{arxiv.1505.00547,
title = {Topological metrology and its application to optical position sensing},
author = {Nora Tischler and Mathieu L. Juan and Sukhwinder Singh and Xavier Zambrana-Puyalto and Xavier Vidal and Gavin Brennen and Gabriel Molina-Terriza},
journal= {arXiv preprint arXiv:1505.00547},
year = {2015}
}
Comments
Compared to the previous version, parts of Section II have been moved to Appendix A