English
Related papers

Related papers: Si/SiO$_\text{2}$ MOSFET Reliability Physics: From…

200 papers

We studied the oxygen vacancies($V_{O}$) in rutile TiO2 by using $G_0W_0$ approximation on top of GGA+$U$ as a method of choice to improve the gap. Since there is no extensive agreement regarding the characteristic of electron localization…

Strongly Correlated Electrons · Physics 2010-12-30 Ali Kazempour , Seyed Javad Hashemifar , Hadi Akbarzadeh

Vanadium is a transition metal with multiple oxidation states and V2O5 is the most stable form among them. Besides catalysis, chemical sensing and photo-chromatic applications, V2O5 is also reported to exhibit a semiconductor to metal…

Materials Science · Physics 2018-01-03 Raktima Basu , Sandip Dhara

The defect stability in a prototypical perovskite oxide superlattice consisting of SrTiO$_3$ and PbTiO$_3$ (STO/PTO) is determined using first principles density functional theory calculations. Specifically, the oxygen vacancy formation…

The Si/SiO$_2$ interface is populated by isolated trap states which modify its electronic properties. These traps are of critical interest for the development of semiconductor-based quantum sensors and computers, as well as nanoelectronic…

Materials Science · Physics 2024-04-08 Megan Cowie , Taylor J. Z. Stock , Procopios C. Constantinou , Neil Curson , Peter Grütter

Point defects in silicon carbide (SiC), particularly the negatively-charged silicon vacancy ($\mathrm{V_{Si}^{-}}$) in 4H-SiC, are leading candidates for scalable quantum technologies due to their favorable spin-optical properties and…

A defect model involving cation and anion vacancies and anti-site defects is proposed that accounts for the non-stoichiometry of multi-valent $A$-site Na$_{0.5}$Bi$_{0.5}$TiO$_3$ based perovskite oxides with $ABO_3$ composition. A series of…

Materials Science · Physics 2026-01-09 Pengcheng Hu , Chinmay Chandan Parhi , Jurij Koruza , Andreas Klein

The structural and electronic properties of amorphous silicon ($a$-Si) are investigated by first-principles calculations based on the density-functional theory (DFT), focusing on the intrinsic structural defects. By simulated melting and…

Materials Science · Physics 2017-10-11 Yoritaka Furukawa , Yu-ichiro Matsushita

The excited holes occupying the valence band tail states in amorphous oxide semiconductors are found to induce formation of meta-stable O$_2^{2-}$ peroxide defects. The valence band tail states are at least partly characterized by the O-O…

Materials Science · Physics 2011-12-22 Ho-Hyun Nahm , Yong-Sung Kim , Dae Hwan Kim

After nearly half a century of research into the bias temperature instability (BTI), two classes of models have emerged as the strongest contenders: one class of models, the reaction-diffusion models, is built around the idea that hydrogen…

Mesoscale and Nanoscale Physics · Physics 2015-06-22 Tibor Grasser , Karina Rott , Hans Reisinger , Michael Waltl , Franz Schanovsky , Ben Kaczer

Plasticity in body centered cubic (bcc) refractory metals are largely due to the stress tensor induced either by solute or thermal activation. The mechanism of the solute atom(s) residence causes instability in such metals. Earlier research…

Materials Science · Physics 2021-07-23 Henry Martin , Peter Amoako-Yirenkyi , Eric Kwabena Kyeh Abavare

An extensive search for low-energy lithium defects in crystalline silicon using density-functional-theory methods and the ab initio random structure searching (AIRSS) method shows that the four-lithium-atom substitutional point defect is…

Materials Science · Physics 2013-05-28 Andrew J. Morris , R. J. Needs , Elodie Salager , C. P. Grey , Chris J. Pickard

In this work an overall electronic structure including the position and formation energies of various intrinsic defects are computed for anatase using Density Functional Theory aided by Hubbard correction (DFT+U). The intrinsic point…

Isolated oxygen impurities and fully oxidized structures of four stable two-dimensional (2D) SiS structures are investigated by {\em ab initio} density functional calculations. Binding energies of oxygen impurities for all the four 2D SiS…

Materials Science · Physics 2019-04-23 Zhengnan Li , Shuai Dong , Jie Guan

Nonvolatile bipolar resistive switching has been observed in an Au/BiFeO3/Pt structure, where a Schottky contact and a quasi-Ohmic contact were formed at the Au/BiFeO3 and BiFeO3/Pt interface, respectively. By changing the polarity of the…

Materials Science · Physics 2011-06-30 Yao Shuai , Shengqiang Zhou , Danilo Bürger , Manfred Helm , Heidemarie Schmidt

Lattice defects such as stacking faults may obscure electronic topological features of real materials. In fact, defects are a source of disorder that can enhance the density of states and conductivity of the bulk of the system and they…

Mesoscale and Nanoscale Physics · Physics 2022-10-05 Gabriele Naselli , Viktor Könye , Sanjib Kumar Das , G. G. N. Angilella , Anna Isaeva , Jeroen van den Brink , Cosma Fulga

Ni-rich cathode materials achieve both high voltages and capacities in Li-ion batteries but are prone to structural instabilities and oxygen loss via the formation of singlet oxygen. Using ab initio molecular dynamics simulations, we…

The electronic and energy properties of beta-Si3N4 (a), Si{6-x}AlxOxN{8-x} (b) and the hypothetical ordered solid solutions Si{6-x}MgxO{2x}N{8-2x} (c), Si{6-x}MgxOxN{8-2x}Sx (d), Si{6-x}MgxOxN{8-x} (e), Si{6-x}Mg{x/2}Al{x/2}OxN{8-x} (f) are…

Materials Science · Physics 2007-05-23 S. V. Okatov

MOSFETs based on wide band-gap semiconductors are suitable for operations at high temperature, at which additional atomic-scale processes that are benign at lower temperatures can get activated which results in device degradation. Recently…

Materials Science · Physics 2016-06-13 Xiao Shen , Sarit Dhar , Sokrates T. Pantelides

We investigate anomalous electrical transport properties of a Ni-TiO2 hybrid system displaying a unique nanostructured morphology. The system undergoes an insulator to metal transition below 150 K with a low temperature metallic phase that…

Fast-responding trap states introduced by NO-annealing are suspected to limit the channel mobility of 4H-SiC MOSFETs, yet their microscopic characterization remains challenging because conventional electrical methods are spatially averaged…