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The evolution of the scanning modules for scanning transmission electron microscopes (STEM) has realized the possibility to generate arbitrary scan pathways, an approach currently explored to improve acquisition speed and to reduce electron…

Electron tomography in materials science has flourished with the demand to characterize nanoscale materials in three dimensions (3D). Access to experimental data is vital for developing and validating reconstruction methods that improve…

We present the design and implementation of a side entry laser system designed for an ultra-high vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can…

Sample thickness is an important parameter in transmission electron microscopy (TEM) imaging, for interpreting image contrast and understanding the relationship between properties and microstructure. In this study, we introduce a method for…

Materials Science · Physics 2021-11-15 Pengfei Nan , Zhiyao Liang , Yue Zhang , Yangrui Liu , Dongsheng Song , Binghui Ge

Instrumentation developments in electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) one decade ago paved the way for combining milli-electronvolt energy resolution in spectroscopy with…

Mesoscale and Nanoscale Physics · Physics 2024-10-15 Benedikt Haas , Christoph T. Koch , Peter Rez

We propose a Zernike phase contrast electron microscope that uses an intense laser focus to convert a phase image into a visible image. We present the relativistic quantum theory of the phase shift caused by the laser-electron-interaction,…

Instrumentation and Detectors · Physics 2010-09-10 Holger Mueller , Jian Jin , Radostin Danev , John Spence , Howard Padmore , Robert M. Glaeser

Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a…

Image and Video Processing · Electrical Eng. & Systems 2020-05-21 Jeffrey M. Ede , Richard Beanland

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

Structured illumination can reject out-of-focus signal from a sample, enabling high-speed and high-contrast imaging over large areas with widefield detection optics. Currently, this optical-sectioning technique is limited by image…

Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent…

Aspects of transmission electron goniometry are discussed. Combined with high resolution phase contrast transmission electron microscopy (HRTEM) and atomic resolution scanning TEM (STEM) in the atomic number contrast (Z-STEM) or the phase…

Materials Science · Physics 2007-05-23 Peter Moeck , Philip Fraundorf

A Scanning Tunneling Microscope (STM) is one of the most important scanning probe tools available to study and manipulate matter at the nanoscale. In a STM, a tip is scanned on top of a surface with a separation of a few \AA. Often, the…

Space charge layers (SCLs) at grain boundaries play a crucial role in modulating local electric fields and influencing the functional properties of materials, such as oxygen vacancy migration and ionic conductivity in oxide ceramics.…

We explore the possibility of applying physical phase plates (PPs) in combination with aberration-corrected transmission electron microscopy. Phase-contrast transfer characteristics are calculated and compared for a thin-film based Zernike…

Instrumentation and Detectors · Physics 2022-05-10 Simon Hettler , Raul Arenal

High-resolution transmission electron microscopy (HRTEM) is an important method for imaging beam sensitive materials often under cryo conditions. Electron ptychography in the scanning transmission electron microscope (STEM) has been shown…

Materials Science · Physics 2025-09-19 Felix Bennemann , Angus I. Kirkland , David A. Muller , Peter Nellist

Scanning Tunneling Microscopy (STM) has revolutionized our atomic scale understanding of surfaces and accelerated progress in nanotechnology. This technique, however, is restricted to metal or semiconducting samples, as it requires a tiny…

Instrumentation and Detectors · Physics 2026-04-16 M. J. Rost

Phase contrast techniques, such as differential interference contrast (DIC) microscopy, are widely used to provide morphological images of unstained biological samples. The trans-illumination geometry required for these techniques has…

Optics · Physics 2015-03-13 Tim N. Ford , Kengyeh K. Chu , Jerome Mertz

Transmission electron microscopy at very low energy is a promising way to avoid damaging delicate biological samples with the incident electrons, a known problem in conventional transmission electron microscopy. For imaging in the 0-30 eV…

Materials Science · Physics 2020-09-22 Peter S. Neu , Daniël Geelen , Aniket Thete , Rudolf M. Tromp , Sense Jan van der Molen

Laser-based preparation, manipulation, and readout of the states of quantum particles has become a powerful research tool that has enabled the most precise measurements of time, fundamental constants, and electromagnetic fields. Laser…

Quantum Physics · Physics 2018-12-12 O. Schwartz , J. J. Axelrod , S. L. Campbell , C. Turnbaugh , R. M. Glaeser , H. Müller

Twisted 2D material heterostructures provide an exciting platform for investigating new fundamental physical phenomena. Many of the most interesting behaviours emerge at small twist angles, where the materials reconstruct to form areas of…

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