Related papers: Defect detection and size classification in CdTe s…
Traditional Statistical Process Control methodologies face several challenges when monitoring defects in complex geometries, such as those of products obtained via Additive Manufacturing techniques. Many approaches cannot be applied in…
Atomic defects underpin the properties of van der Waals materials, and their understanding is essential for advancing quantum and energy technologies. Scanning transmission electron microscopy is a powerful tool for defect identification in…
A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in…
GeSn has emerged as a promising semiconductor with optoelectronic functionality in the mid-infrared, with the potential of replacing expensive III-V technology for monolithic on-chip Si photonics. Multiple challenges to achieve…
We characterize the astrometric distortion at the edges of thick, fully-depleted CCDs in the lab using a bench-top simulation of LSST observing. By illuminating an array of forty thousand pinholes (30mu m diameter) at the object plane of a…
3D silicon detectors are characterized by cylindrical electrodes perpendicular to the surface and penetrating into the bulk material in contrast to standard Si detectors with planar electrodes on its top and bottom. This geometry renders…
Additive manufacturing (AM), particularly 3D printing, has revolutionized the production of complex structures across various industries. However, ensuring quality and detecting defects in 3D-printed objects remain significant challenges.…
The optical absorbance of 2D semiconductors is generalized to individual lattice sites through the topological marker formalism, yielding an absorbance marker. This marker allows to investigate the atomic scale variation of absorbance…
Three-dimensional electron diffraction (3D ED) has emerged as a powerful method for solving the structures of sub-micron-sized particles down to nanoparticles. However, it faces technical challenges when applied to beam-sensitive samples or…
We introduce the first comprehensive 3D dataset for the task of unsupervised anomaly detection and localization. It is inspired by real-world visual inspection scenarios in which a model has to detect various types of defects on…
As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the…
Industrial surface defect inspection for sample-wise quality control (QC) must simultaneously decide whether a given sample contains defects and localize those defects spatially. In real production lines, extreme foreground-background…
Optical inspection of 1191 silicon micro-strip sensors was performed using a custom made optical inspection setup, employing a machine-learning based approach for the defect analysis and subsequent quality assurance. Furthermore,…
It has been a widely growing interest in using silicon carbide (SiC)in high-power electronic devices. Yet, SiC wafers may contain killer defects that could reduce fabrication yield and make the device fall into unexpected failures. To…
CCD sensors do not deliver a perfect image of the light they receive. Beyond the well known linear image smearing due to diffusion of charges during their drift towards the pixel wells, non-linear effects are at play in these sensors. We…
Negative refraction is known to occur in materials that simultaneously possess a negative electric permittivity and magnetic permeability; hence they are termed negative index materials. However, there are no known natural materials that…
Three-dimensional finely grained plastic scintillator detectors bring many advantages in particle detectors, allowing a massive active target which enables a high-precision tracking of interaction products, excellent calorimetry and a…
The development of CdZnTe detectors with an orthogpnal coplanar anode structure has important implications for future astrophysical instrumentation. As electron-only devices, like pixel detectors, coplanar anode strip detectors can be…
In industrial settings, surface defects on steel can significantly compromise its service life and elevate potential safety risks. Traditional defect detection methods predominantly rely on manual inspection, which suffers from low…
We present a systematic methodology for the accurate calculation of defect structures in supercells which we illustrate with a study of the neutral vacancy in silicon. This is a prototypical defect which has been studied extensively using…