Related papers: Defect detection and size classification in CdTe s…

Machine-vision-based defect classification techniques have been widely adopted for automatic quality inspection in manufacturing processes. This article describes a general framework for classifying defects from high volume data batches…

Plastic scintillator detectors with three-dimensional granularity and sub-nanosecond time resolution offer simultaneous particle tracking, identification, and calorimetry. However, scaling to larger volumes and finer segmentation poses…

Light scattering in disordered media has been studied extensively due to its prevalence in natural and artificial systems [1]. In the field of photonics most of the research has focused on understanding and mitigating the effects of…

Semiconducting nanoparticles are the building blocks of optical nanodevices as their electronic states, and therefore light absorption and emission, can be controlled by modifying their size and shape. CdSe is perhaps the most studied of…

Industry practitioners care about small improvements in malware detection accuracy because their models are deployed to hundreds of millions of machines, meaning a 0.1\% change can cause an overwhelming number of false positives. However,…

Photonic crystals with a sufficiently high refractive index contrast display partial or full band gaps. However, imperfections in the metamaterial cause light scattering and extinction of the interfering propagating waves. Positive as well…

This study introduces a novel self-supervised learning approach for volumetric segmentation of defect indications captured by phased array ultrasonic testing data from Carbon Fiber Reinforced Polymers (CFRPs). By employing this…

Defect cavities in 3D photonic crystal can trap and store light in the smallest volumes allowable in dielectric materials, enhancing non-linearities and cavity QED effects. Here, we study inverse rod-connected diamond (RCD) crystals…

Efficient automated print defect mapping is valuable to the printing industry since such defects directly influence customer-perceived printer quality and manually mapping them is cost-ineffective. Conventional methods consist of…

Purpose: Developing photon-counting CT detectors requires understanding the impact of parameters such as converter material, absorption length and pixel size. We apply a novel linear-systems framework, incorporating spatial and energy…

New production techniques have emerged that have made it possible to produce metal parts with more complex shapes, making the quality control process more difficult. This implies that the visual and superficial analysis has become even more…

Charge Coupled Devices (CCDs) have been successfully used in several high energy physics experiments over the past two decades. Their high spatial resolution and thin sensitive layers make them an excellent tool for studying short-lived…

Silicon detectors have gained in popularity since silicon became a widely used micro/nanoelectronic semiconductor material. Silicon detectors are used in particle physics as well as imaging for pixel based detecting systems. Over the past…

Solid-state quantum coherent devices are quickly progressing. Superconducting circuits, for instance, have already been used to demonstrate prototype quantum processors comprising a few tens of quantum bits. This development also revealed…

The scanning mid-IR-laser microscopy was previously demonstrated as an effective tool for characterization of different semiconductor crystals. Now the technique has been successfully applied for the investigation of CZ SixGe1-x -- a…

Electronic devices are extremely sensitive to defects in their constituent semiconductors, but locating electronic point defects in bulk semiconductors has previously been impossible. Here we apply scanning transmission electron microscopy…

We propose a new scintillation-type detector in which high-energy radiation produces electron-hole pairs in a direct-gap semiconductor material that subsequently recombine producing infrared light to be registered by a photo-detector. The…

The manufacturing of light-emitting diodes is a complex semiconductor-manufacturing process, interspersed with different measurements. Among the employed measurements, photoluminescence imaging has several advantages, namely being a…

This paper presents a method to detect reflection of 3D light detection and ranging (Lidar) scans and uses it to classify the points and also map objects outside the line of sight. Our software uses several approaches to analyze the point…

As capturing devices become common, 3D scans of interior spaces are acquired on a daily basis. Through scene comparison over time, information about objects in the scene and their changes is inferred. This information is important for…