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A modified electron beam induced deposition method using a parallel beam of electrons is developed. The method relies on the build-up of surface potential on an insulating surface exposed to an electron beam. Presence of sharp edges on the…

Materials Science · Physics 2009-11-13 Joysurya Basu , C. Barry Carter , R. Divakar , Vijay B. Shenoy , N. Ravishankar

Scanning Electron Microscopy (SEM) experiments provide detailed insights into material microstructures, enabling high-resolution imaging as well as crystallographic analysis through advanced techniques like Electron Backscatter Diffraction…

Materials Science · Physics 2024-12-05 Christina Koenig , Alice Bastos da Silva Fanta , Joerg R. Jinschek

Recent advances in scanning transmission electron microscopy (STEM) instrumentation have made it possible to focus electron beams with sub-atomic precision and to identify the chemical structure of materials at the level of individual…

Materials Science · Physics 2017-03-08 T. Susi , J. C. Meyer , J. Kotakoski

Environmental transmission electron microscopy (E-TEM) enables direct observation of nanoscale chemical processes crucial for catalysis and materials design. However, the high-energy electron probe can dramatically alter reaction pathways…

Direct-write processes enable the alteration or deposition of materials in a continuous, directable, sequential fashion. In this work we demonstrate an electron beam direct-write process in an aberration-corrected scanning transmission…

Materials Science · Physics 2023-03-22 Ondrej Dyck , Andrew R. Lupini , Stephen Jesse

Directed atomic fabrication using an aberration-corrected scanning transmission electron microscope (STEM) opens new pathways for atomic engineering of functional materials. In this approach, the electron beam is used to actively alter the…

The force exerted on nanoparticles and atomic clusters by fast passing electrons like those employed in transmission electron microscopes are calculated and integrated over time to yield the momentum transferred from the electrons to the…

Atomic and Molecular Clusters · Physics 2007-08-08 F. J. Garcia de Abajo

The force exerted on nanoparticles and atomic clusters by fast passing electrons like those employed in transmission electron microscopes are calculated and integrated over time to yield the momentum transferred from the electrons to the…

Other Condensed Matter · Physics 2009-11-13 F. J. Garcia de Abajo

Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…

The shape of metal nanoparticles embedded in dielectric matrices influences the optical properties of the composite material. Swift heavy ion irradiation can induce a controllable shape transformation in gold and other metals embedded in…

Materials Science · Physics 2022-04-22 Aleksi A. Leino , Ville E. Jantunen , Flyura Djurabekova

Beam shaping - the ability to engineer the phase and the amplitude of massive and massless particles - has long interested scientists working on communication, imaging and the foundations of quantum mechanics. In light optics, the shaping…

The direct manipulation of individual atoms in materials using scanning probe microscopy has been a seminal achievement of nanotechnology. Recent advances in imaging resolution and sample stability have made scanning transmission electron…

A new type of excitations by highly focused electron beams in scanning transmission electron microscopes is predicted for nanoparticles. The calculated electron energy loss spectra of metallic (silver) and insulating (SiO(sub2))…

Materials Science · Physics 2011-11-09 M. A. Itskovsky , H. Cohen , T. Maniv

Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…

Instrumentation and Detectors · Physics 2022-07-27 Frances Quigley , Patrick McBean , Peter O'Donovan , Jonathan J. P. Peters , Lewys Jones

The creation of point defects in the crystal lattices of various semiconductors by subthreshold events has been reported on by a number of groups. These observations have been made in great detail using sensitive electrical techniques but…

Materials Science · Physics 2017-11-22 Sergio M. M. Coelho , Juan F. R. Archilla , F. Danie Auret , Jackie M. Nel

A new material characterization technique is emerging for the transmission electron microscope (TEM). Using electron energy-loss spectroscopy, real space mappings of the underlying electronic transitions in the sample, so called orbital…

Materials Science · Physics 2023-05-26 Manuel Ederer , Stefan Löffler

Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when…

Instrumentation and Detectors · Physics 2018-12-05 Fehmi S. Yasin , Tyler R. Harvey , Jordan J. Chess , Jordan S. Pierce , Colin Ophus , Peter Ercius , Benjamin J. McMorran

Pyroelectric crystals are used to produce self-focused electron beams with energies greater than 170 keV. No high voltage power supply or electron gun is needed. The system works by simply changing the temperature of a crystal of LiNbO3 or…

Plasma Physics · Physics 2007-05-23 James D. Brownridge , Stephen M. Shafroth

Coherent electrons such as those in electron microscopes, exhibit wave phenomena and may be described by the paraxial wave equation. In analogy to light-waves, governed by the same equation, these electrons share many of the fundamental…

Optics · Physics 2014-07-17 Roy Shiloh , Yossi Lereah , Yigal Lilach , Ady Arie

Spatial and temporal light modulation is a well-established technology that enables dynamic shaping of the phase and amplitude of optical fields, significantly enhancing the resolution and sensitivity of imaging methods. Translating this…

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