A modified electron beam induced deposition method using a parallel beam of electrons is developed. The method relies on the build-up of surface potential on an insulating surface exposed to an electron beam. Presence of sharp edges on the insulating surface implies presence of large electric fields that lead to site-specific nucleation of metal vapor on those regions. Feature sizes as small as 20 nm can be deposited without the need to use fine probes and thus the limitation of probe size imposed on the resolution is overcome. The use of pure metal vapor also renders the process inherently clean.
@article{arxiv.0809.1548,
title = {Modified Electron Beam Induced Deposition of Metal Nanostructure Arrays using a Parallel Electron Beam},
author = {Joysurya Basu and C. Barry Carter and R. Divakar and Vijay B. Shenoy and N. Ravishankar},
journal= {arXiv preprint arXiv:0809.1548},
year = {2009}
}
Comments
14 Pages, 3 figures, to appear in Applied Physics Letters