Related papers: Quantitative Formulation of Frequency-Dependent Av…
We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…
Ambient operation poses a challenge to AFM because in contrast to operation in vacuum or liquid environments, the cantilever dynamics change dramatically from oscillating in air to oscillating in a hydration layer when probing the sample.…
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…
Quartz tuning fork-based atomic force microscopy (QTF-AFM) has become a powerful tool for high-resolution imaging of both conductive and insulating samples, including semiconductor structures and metal-coated surfaces as well as soft matter…
This article describes how a frequency modulation AFM using a hanging fiber force probe made from a quartz tuning fork provides local measurements on liquid-liquid interfaces. After detailing the manufacture and calibration of the force…
The atomic force microscope is a versatile tool that allows many routes to be used for investigating the mechanical properties of soft materials on the nanometer scale. In the present work, experiments were performed on polystyrene polymer…
Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as well as the sample are contaminated, and it is not clear how…
Using Atomic Force Microscopes (AFM) to manipulate nano-objects is an actual challenge for surface scientists. Basic haptic interfacesbetween the AFM and experimentalists have already been implemented. Themulti-sensory renderings (seeing,…
A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…
We discuss the influence of external forces on the motion of the tip in dynamic atomic force microscopy (AFM). First, a compact solution for the steady-state problem is derived employing a Fourier approach. Founding on this solution, we…
We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its…
The description of hydrodynamic interactions between a particle and the surrounding liquid, down to the nanometer scale, is of primary importance since confined liquids are ubiquitous in many natural and technological situations. In this…
This study presents an advanced numerical framework that integrates experimentally acquired Atomic Force Microscope (AFM) data into high-fidelity simulations for adhesive rough contact problems, bridging the gap between experimental physics…
The all-temperature magnon (ATM) theory [J. Phys. Condens. Matter 21, 336003/1-14, 2009] has been used to analyze the temperature dependence of magnetization as well as the internal energy components of a mono-domain ferromagnetic solid.…
When measuring quadratic values representative of random fluctuations, such as the thermal noise of Atomic Force Microscopy (AFM) cantilevers, the background measurement noise cannot be averaged to zero. We present a signal processing…
Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This is performed without reference to a global standard, which hinders robust comparison of…
We present theoretical and experimental results on the mechanical damping of an atomic force microscope cantilever strongly coupled to a self-assembled InAs quantum dot. When the cantilever oscillation amplitude is large, its motion…
We present a contactless method for measuring the elastic modulus of living cells (human triple-negative breast cancer, MDA-MB-231) from the thermal fluctuations of an atomic force microscope (AFM) cantilever. By analyzing the power…
Atomic force microscope (AFM) generally works on the basis of manipulating absolute magnitude of van der Waals (vdW) force between the tip and specimen. The force is, however, less sensitive to alternation of atom species than to tip-sample…
We investigate nano scanning in tapping mode atomic force microscopy (AFM) under quality (Q) control via numerical simulations performed in SIMULINK. We focus on the simulation of whole scan process rather than the simulation of cantilever…