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The Scanning electron microscope (SEM) and Electron-Dispersive Spectroscope (EDS) are two highly effective instruments in the field of nanoscience and nanotechnology. The quality of these instruments is determined by various factors, with…

Applied Physics · Physics 2023-10-24 Hamidreza Moradi , Fatemeh Mehradnia

Structural and compositional inhomogeneity is common in zeolites and considerably affects their properties. Conventional transmission electron microscopy (TEM) cannot provide sufficient information on local structures in zeolites due to the…

Alloys of Bi$_2$Te$_3$ and Sb$_2$Te$_3$ ((Bi$_{1-x}$Sb$_x$)$_2$Te$_3$) have played an essential role in the exploration of topological surface states, allowing us to study phenomena that would otherwise be obscured by bulk contributions to…

Materials Science · Physics 2018-04-04 Kane L Scipioni , Zhenyu Wang , Yulia Maximenko , Ferhat Katmis , Charlie Steiner , Vidya Madhavan

Manipulating the size and orientation of quantum materials is often used to tune emergent phenomena, but precise control of these parameters is also necessary from an experimental point of view. Various synthesis techniques already exist,…

Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{\AA}ngstr\"om probe is a complex…

The rise of nanotechnology has created an ever-increasing need to probe structures on the atomic scale, to which transmission electron microscopy has largely been the answer. Currently, the only way to efficiently thin arbitrary bulk…

Materials Science · Physics 2015-03-19 Eero Holmström , Jani Kotakoski , Lorenz Lechner , Ute Kaiser , Kai Nordlund

Thin films of inorganic materials as Tin-doped indium oxide, titanium oxide, Niobium doped titanium oxide, were deposited for comparison on glass and Polyethylene terephthalate (PET) substrates with a DC sputtering method. These thin films…

Applied Physics · Physics 2017-11-22 Mohammed Rasheed , Regis Barille

Networks of solution-processed nanomaterials are important for multiple applications in electronics, sensing and energy storage/generation. While it is known that network morphology plays a dominant role in determining the physical…

This paper introduces an accurate edge-based smoothed finite element method (ES-FEM) for electromagnetic analysis for both two dimensional cylindrical and three dimensional cartesian systems, which shows much better performance in terms of…

Computational Engineering, Finance, and Science · Computer Science 2019-10-30 Yangfan Zhang , Pengfei Wang , Wenping Li , Shunchuan Yang

Harnessing electron spin is crucial in developing energy-saving and high-speed devices for the next generation. In this scheme, visualizing spin-polarized electronic states aids in designing and developing new materials and devices.…

Materials Science · Physics 2024-04-03 Koichiro Yaji , Shunsuke Tsuda

Observing the individual building blocks of matter is one of the primary goals of microscopy. The invention of the scanning tunneling microscope [1] revolutionized experimental surface science in that atomic-scale features on a solid-state…

Materials Science · Physics 2008-08-04 Jannik C. Meyer , C. O. Girit , M. F. Crommie , A. Zettl

Amorphous silicon films prepared by electron beam evaporation have systematically and substantially greater atomic density for higher thickness, higher growth temperature, and slower deposition rate, reaching the density of crystalline Si…

Materials Science · Physics 2022-04-27 H. C. Jacks , M. Molina-Ruiz , M. H. Weber , J. J. Maldonis , P. M. Voyles , T. H. Metcalf , X. Liu , F. Hellman

The evolution of the scanning modules for scanning transmission electron microscopes (STEM) has realized the possibility to generate arbitrary scan pathways, an approach currently explored to improve acquisition speed and to reduce electron…

Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its…

Deep learning has demonstrated superb efficacy in processing imaging data, yet its suitability in solving challenging inverse problems in scientific imaging has not been fully explored. Of immense interest is the determination of local…

Materials Science · Physics 2019-02-20 Nouamane Laanait , Qian He , Albina Y. Borisevich

Metal mixed polymers are a cheap and effective way to produce flexible metals and superconductors. As part of an on-going effort to learn how to tune the properties of these systems with ion implantation, we present a study of the…

Materials Science · Physics 2009-06-15 Andrew P. Stephenson , Ujjual Divakar , Adam P. Micolich , Paul Meredith , Ben J. Powell

Low-energy electron microscopy (LEEM) was used to measure the reflectivity of low-energy electrons from graphitized SiC(0001). The reflectivity shows distinct quantized oscillations as a function of the electron energy and graphite…

Materials Science · Physics 2009-11-13 H. Hibino , H. Kageshima , F. Maeda , M. Nagase , Y. Kobayashi , H. Yamaguchi

Synthesis of rationally designed nanostructured materials with optimized mechanical properties, e.g., high strength with considerable ductility, requires rigorous control of diverse microstructural parameters including the mean size, size…

Materials Science · Physics 2017-01-27 Rohit Sarkar , Jagannathan Rajagopalan

Accurate thermal analysis of composites and porous media requires detailed characterization of local thermal properties in small scale. For some important applications such as lithium-ion batteries, changes in the properties during the…

Applied Physics · Physics 2020-10-06 Fazlolah Mohaghegh , Jayathi Murthy

Transmission electron microscopy at very low energy is a promising way to avoid damaging delicate biological samples with the incident electrons, a known problem in conventional transmission electron microscopy. For imaging in the 0-30 eV…

Materials Science · Physics 2020-09-22 Peter S. Neu , Daniël Geelen , Aniket Thete , Rudolf M. Tromp , Sense Jan van der Molen
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