Networks of solution-processed nanomaterials are important for multiple applications in electronics, sensing and energy storage/generation. While it is known that network morphology plays a dominant role in determining the physical properties of printed networks, it remains difficult to quantify network structure. Here, we utilise FIB-SEM nanotomography to characterise the morphology of nanostructured networks. Nanometer-resolution 3D-images were obtained from printed networks of graphene nanosheets of various sizes, as well as networks of WS2 nanosheets, silver nanosheets and silver nanowires. Important morphological characteristics, including network porosity, tortuosity, pore dimensions and nanosheet orientation were extracted and linked to network resistivity. By extending this technique to interrogate the structure and interfaces within vertical printed heterostacks, we demonstrate the potential of this technique for device characterisation and optimisation.
@article{arxiv.2301.11046,
title = {3D-imaging of Printed Nanostructured Networks using High-resolution FIB-SEM Nanotomography},
author = {Cian Gabbett and Luke Doolan and Kevin Synnatschke and Laura Gambini and Emmet Coleman and Adam G. Kelly and Shixin Liu and Eoin Caffrey and Jose Munuera and Catriona Murphy and Stefano Sanvito and Lewys Jones and Jonathan N. Coleman},
journal= {arXiv preprint arXiv:2301.11046},
year = {2023}
}