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Related papers: Defect Spectrum: A Granular Look of Large-Scale De…

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The development of computer vision and in-situ monitoring using visual sensors allows the collection of large datasets from the additive manufacturing (AM) process. Such datasets could be used with machine learning techniques to improve the…

Computer Vision and Pattern Recognition · Computer Science 2023-09-06 Xiao Liu , Alessandra Mileo , Alan F. Smeaton

Defect prediction has been a popular research topic where machine learning (ML) and deep learning (DL) have found numerous applications. However, these ML/DL-based defect prediction models are often limited by the quality and size of their…

Software Engineering · Computer Science 2023-07-26 Parvez Mahbub , Ohiduzzaman Shuvo , Mohammad Masudur Rahman

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and…

Computer Vision and Pattern Recognition · Computer Science 2022-08-31 Luca Frittoli , Diego Carrera , Beatrice Rossi , Pasqualina Fragneto , Giacomo Boracchi

IT industry should inculcate effective defect management on a continual basis to deploy nearly a zerodefect product to their customers. Inspection is one of the most imperative and effective strategies of defect management. Nevertheless,…

Software Engineering · Computer Science 2012-10-01 Suma V. , T. R. Gopalakrishnan Nair

In industrial equipment monitoring, fault diagnosis is critical for ensuring system reliability and enabling predictive maintenance. However, the scarcity of fault data, due to the rarity of fault events and the high cost of data…

Machine Learning · Computer Science 2025-11-20 Yi Xu , Zhigang Chen , Rui Wang , Yangfan Li , Fengxiao Tang , Ming Zhao , Jiaqi Liu

Additive Manufacturing (AM) is transforming the manufacturing sector by enabling efficient production of intricately designed products and small-batch components. However, metal parts produced via AM can include flaws that cause inferior…

Computer Vision and Pattern Recognition · Computer Science 2024-11-05 Duy Nhat Phan , Sushant Jha , James P. Mavo , Erin L. Lanigan , Linh Nguyen , Lokendra Poudel , Rahul Bhowmik

In this work, we for the first time present a method for detecting label errors in image datasets with semantic segmentation, i.e., pixel-wise class labels. Annotation acquisition for semantic segmentation datasets is time-consuming and…

Computer Vision and Pattern Recognition · Computer Science 2024-08-27 Matthias Rottmann , Marco Reese

The identification and removal of systematic errors in object detectors can be a prerequisite for their deployment in safety-critical applications like automated driving and robotics. Such systematic errors can for instance occur under very…

Computer Vision and Pattern Recognition · Computer Science 2023-09-26 Valentyn Boreiko , Matthias Hein , Jan Hendrik Metzen

Evaluating diffusion-based image-editing models is a crucial task in the field of Generative AI. Specifically, it is imperative to assess their capacity to execute diverse editing tasks while preserving the image content and realism. While…

Computer Vision and Pattern Recognition · Computer Science 2024-10-10 Stefan Stefanache , Lluís Pastor Pérez , Julen Costa Watanabe , Ernesto Sanchez Tejedor , Thomas Hofmann , Enis Simsar

Medical image segmentation models struggle with rare abnormalities due to scarce annotated pathological data. We propose DiffAug a novel framework that combines textguided diffusion-based generation with automatic segmentation validation to…

Computer Vision and Pattern Recognition · Computer Science 2025-08-26 Maham Nazir , Muhammad Aqeel , Francesco Setti

The efficacy of Artificial Intelligence (AI) in micro/nano manufacturing is fundamentally constrained by the scarcity of high-quality and physically grounded training data for defect inspection. Lithography defect data from semiconductor…

Computer Vision and Pattern Recognition · Computer Science 2025-12-11 Yuehua Hu , Jiyeong Kong , Dong-yeol Shin , Jaekyun Kim , Kyung-Tae Kang

A key algorithm for understanding the world is material segmentation, which assigns a label (metal, glass, etc.) to each pixel. We find that a model trained on existing data underperforms in some settings and propose to address this with a…

Computer Vision and Pattern Recognition · Computer Science 2022-07-22 Paul Upchurch , Ransen Niu

Automated test-generation research overwhelmingly assumes the correctness of focal methods, yet practitioners routinely face non-regression scenarios where the focal method may be defective. A baseline evaluation of EVOSUITE and two leading…

Software Engineering · Computer Science 2026-02-03 Pengyu Xue , Yuxiang Zhang , Zhen Yang , Xiaoxue Ren , Xiang Li , Pengfei Hu , Linhao Wu , Kainan Li

This work is addressing the problem of defect anomaly detection based on a clean reference image. Specifically, we focus on SEM semiconductor defects in addition to several natural image anomalies. There are well-known methods to create a…

Computer Vision and Pattern Recognition · Computer Science 2023-03-22 Nati Ofir , Yotam Ben Shoshan , Ran Badanes , Boris Sherman

The surface defect detection method based on visual perception has been widely used in industrial quality inspection. Because defect data are not easy to obtain and the annotation of a large number of defect data will waste a lot of…

Computer Vision and Pattern Recognition · Computer Science 2022-03-14 Qifan Jin , Li Chen

Automated surface-anomaly detection using machine learning has become an interesting and promising area of research, with a very high and direct impact on the application domain of visual inspection. Deep-learning methods have become the…

Computer Vision and Pattern Recognition · Computer Science 2019-06-12 Domen Tabernik , Samo Šela , Jure Skvarč , Danijel Skočaj

As deep learning models are widely used in software systems, test generation plays a crucial role in assessing the quality of such models before deployment. To date, the most advanced test generators rely on generative AI to synthesize…

Software Engineering · Computer Science 2026-01-21 Xingcheng Chen , Oliver Weissl , Andrea Stocco

Supervised machine learning algorithms play a crucial role in optical quality control within industrial production. These approaches require representative datasets for effective model training. However, while non-defective components are…

Computer Vision and Pattern Recognition · Computer Science 2026-02-02 Dennis Sprute , Hanna Senke , Holger Flatt

The medical imaging literature has witnessed remarkable progress in high-performing segmentation models based on convolutional neural networks. Despite the new performance highs, the recent advanced segmentation models still require large,…

Image and Video Processing · Electrical Eng. & Systems 2020-02-13 Nima Tajbakhsh , Laura Jeyaseelan , Qian Li , Jeffrey Chiang , Zhihao Wu , Xiaowei Ding

The detection of manufacturing errors is crucial in fabrication processes to ensure product quality and safety standards. Since many defects occur very rarely and their characteristics are mostly unknown a priori, their detection is still…

Computer Vision and Pattern Recognition · Computer Science 2020-08-31 Marco Rudolph , Bastian Wandt , Bodo Rosenhahn
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