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The bottleneck in learning-based industrial defect detection is often limited not by model capacity, but by the scarcity of labeled defect data: defects are rare, annotations are expensive, and collecting balanced training sets is slow. We…

Computer Vision and Pattern Recognition · Computer Science 2026-04-30 Paul Julius Kühn , Mika Pommeranz , Arjan Kuijper , Saptarshi Neil Sinha

The presence of any type of defect on the glass screen of smart devices has a great impact on their quality. We present a robust semi-supervised learning framework for intelligent micro-scaled localization and classification of defects on a…

Computer Vision and Pattern Recognition · Computer Science 2020-10-05 M Usman Maqbool Bhutta , Shoaib Aslam , Peng Yun , Jianhao Jiao , Ming Liu

Automatic visual inspection using machine learning plays a key role in achieving zero-defect policies in industry. Research on anomaly detection is constrained by the availability of datasets that capture complex defect appearances and…

Computer Vision and Pattern Recognition · Computer Science 2025-09-22 Paul J. Krassnig , Dieter P. Gruber

The task of industrial detection based on deep learning often involves solving two problems: (1) obtaining sufficient and effective data samples, (2) and using efficient and convenient model training methods. In this paper, we introduce a…

Computer Vision and Pattern Recognition · Computer Science 2024-07-08 Yangfan He , Xinyan Wang , Tianyu Shi

This paper addresses the problem of defect segmentation in semiconductor manufacturing. The input of our segmentation is a scanning-electron-microscopy (SEM) image of the candidate defect region. We train a U-net shape network to segment…

Computer Vision and Pattern Recognition · Computer Science 2022-10-20 Nati Ofir , Ran Yacobi , Omer Granoviter , Boris Levant , Ore Shtalrid

Current saliency-based defect detection methods show promise in industrial settings, but the unpredictability of defects in steel production environments complicates dataset creation, hampering model performance. Existing data augmentation…

Computer Vision and Pattern Recognition · Computer Science 2024-12-23 Yichun Tai , Zhenzhen Huang , Tao Peng , Zhijiang Zhang

A critical yet frequently overlooked challenge in the field of deepfake detection is the lack of a standardized, unified, comprehensive benchmark. This issue leads to unfair performance comparisons and potentially misleading results.…

Computer Vision and Pattern Recognition · Computer Science 2023-10-31 Zhiyuan Yan , Yong Zhang , Xinhang Yuan , Siwei Lyu , Baoyuan Wu

Surface defect inspection is an important task in industrial inspection. Deep learning-based methods have demonstrated promising performance in this domain. Nevertheless, these methods still suffer from misjudgment when encountering…

Computer Vision and Pattern Recognition · Computer Science 2023-09-25 Xiaoheng Jiang , Shilong Tian , Zhiwen Zhu , Yang Lu , Hao Liu , Li Chen , Shupan Li , Mingliang Xu

Detecting anomalies in industrial settings is challenging due to the scarcity of labeled anomalous data. Generative models can mitigate this issue by synthesizing realistic defect samples, but existing approaches often fail to model the…

Computer Vision and Pattern Recognition · Computer Science 2025-03-03 Youngjae Cho , Gwangyeol Kim , Sirojbek Safarov , Seongdeok Bang , Jaewoo Park

We introduce the first comprehensive 3D dataset for the task of unsupervised anomaly detection and localization. It is inspired by real-world visual inspection scenarios in which a model has to detect various types of defects on…

Computer Vision and Pattern Recognition · Computer Science 2022-02-25 Paul Bergmann , Xin Jin , David Sattlegger , Carsten Steger

Cephalometric landmark detection is essential for orthodontic diagnostics and treatment planning. Nevertheless, the scarcity of samples in data collection and the extensive effort required for manual annotation have significantly impeded…

Computer Vision and Pattern Recognition · Computer Science 2025-05-12 Dongqian Guo , Wencheng Han , Pang Lyu , Yuxi Zhou , Jianbing Shen

In-situ monitoring incorporating data from visual and other sensor technologies, allows the collection of extensive datasets during the Additive Manufacturing (AM) process. These datasets have potential for determining the quality of the…

Computer Vision and Pattern Recognition · Computer Science 2024-01-30 Xiao Liu , Alessandra Mileo , Alan F. Smeaton

Semantic segmentation takes pivotal roles in various applications such as autonomous driving and medical image analysis. When deploying segmentation models in practice, it is critical to test their behaviors in varied and complex scenes in…

Computer Vision and Pattern Recognition · Computer Science 2026-03-17 Zijin Yin , Bing Li , Kongming Liang , Hao Sun , Zhongjiang He , Zhanyu Ma , Jun Guo

This paper introduces a methodology for generating synthetic annotated data to address data scarcity in semantic segmentation tasks within the precision agriculture domain. Utilizing Denoising Diffusion Probabilistic Models (DDPMs) and…

Computer Vision and Pattern Recognition · Computer Science 2024-11-07 Andrew Heschl , Mauricio Murillo , Keyhan Najafian , Farhad Maleki

Collecting and annotating datasets for pixel-level semantic segmentation tasks are highly labor-intensive. Data augmentation provides a viable solution by enhancing model generalization without additional real-world data collection.…

Computer Vision and Pattern Recognition · Computer Science 2026-03-20 Huy Che , Dinh-Duy Phan , Duc-Khai Lam

Deep-learning methods have recently started being employed for addressing surface-defect detection problems in industrial quality control. However, with a large amount of data needed for learning, often requiring high-precision labels, many…

Computer Vision and Pattern Recognition · Computer Science 2021-04-21 Jakob Božič , Domen Tabernik , Danijel Skočaj

In this research, we introduce a unified end-to-end Automated Defect Classification-Detection-Segmentation (ADCDS) framework for classifying, detecting, and segmenting multiple instances of semiconductor defects for advanced nodes. This…

Computer Vision and Pattern Recognition · Computer Science 2024-09-09 Bappaditya Dey , Matthias Monden , Victor Blanco , Sandip Halder , Stefan De Gendt

Surface inspection systems are an important application domain for computer vision, as they are used for defect detection and classification in the manufacturing industry. Existing systems use hand-crafted features which require extensive…

Image and Video Processing · Electrical Eng. & Systems 2019-04-10 Selim Arikan , Kiran Varanasi , Didier Stricker

Road networks in cities are massive and is a critical component of mobility. Fast response to defects, that can occur not only due to regular wear and tear but also because of extreme events like storms, is essential. Hence there is a need…

Computer Vision and Pattern Recognition · Computer Science 2018-11-27 Sudhir Yarram , Girish Varma , C. V. Jawahar

In this study, we show that diffusion models can be used in industrial scenarios to improve the data augmentation procedure in the context of surface defect detection. In general, defect detection classifiers are trained on ground-truth…

Computer Vision and Pattern Recognition · Computer Science 2024-06-04 Luigi Capogrosso , Federico Girella , Francesco Taioli , Michele Dalla Chiara , Muhammad Aqeel , Franco Fummi , Francesco Setti , Marco Cristani