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Related papers: Defect Spectrum: A Granular Look of Large-Scale De…

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Automated defect inspection is critical for effective and efficient maintenance, repair, and operations in advanced manufacturing. On the other hand, automated defect inspection is often constrained by the lack of defect samples, especially…

Computer Vision and Pattern Recognition · Computer Science 2021-03-30 Gongjie Zhang , Kaiwen Cui , Tzu-Yi Hung , Shijian Lu

Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose…

Computer Vision and Pattern Recognition · Computer Science 2025-03-28 Jaewoo Song , Daemin Park , Kanghyun Baek , Sangyub Lee , Jooyoung Choi , Eunji Kim , Sungroh Yoon

Training supervised deep neural networks that perform defect detection and segmentation requires large-scale fully-annotated datasets, which can be hard or even impossible to obtain in industrial environments. Generative AI offers…

Computer Vision and Pattern Recognition · Computer Science 2024-01-09 Gabriele Valvano , Antonino Agostino , Giovanni De Magistris , Antonino Graziano , Giacomo Veneri

Data-hunger and data-imbalance are two major pitfalls in many deep learning approaches. For example, on highly optimized production lines, defective samples are hardly acquired while non-defective samples come almost for free. The defects…

Computer Vision and Pattern Recognition · Computer Science 2023-02-17 Ruyu Wang , Sabrina Hoppe , Eduardo Monari , Marco F. Huber

The field of industrial defect detection using machine learning and deep learning is a subject of active research. Datasets, also called benchmarks, are used to compare and assess research results. There is a number of datasets in…

Computer Vision and Pattern Recognition · Computer Science 2023-05-23 Philippe Carvalho , Alexandre Durupt , Yves Grandvalet

Utilizing Convolutional Neural Networks (CNNs), Recurrent Neural Networks (RNNs), and Generative Adversarial Networks (GANs), our system introduces an innovative approach to defect detection in manufacturing. This technology excels in…

Computer Vision and Pattern Recognition · Computer Science 2023-11-09 Arti Kumbhar , Amruta Chougule , Priya Lokhande , Saloni Navaghane , Aditi Burud , Saee Nimbalkar

Software defect datasets, which are collections of software bugs, are essential resources to facilitate empirical research and enable standardized benchmarking for a wide range of software engineering techniques, including emerging areas…

Software Engineering · Computer Science 2026-02-12 Hao-Nan Zhu , Robert M. Furth , Michael Pradel , Cindy Rubio-González

Industrial defect detection is vital for upholding product quality across contemporary manufacturing systems. As the expectations for precision, automation, and scalability intensify, conventional inspection approaches are increasingly…

Computer Vision and Pattern Recognition · Computer Science 2025-07-21 Yuqi Cheng , Yunkang Cao , Haiming Yao , Wei Luo , Cheng Jiang , Hui Zhang , Weiming Shen

Machine-vision-based defect classification techniques have been widely adopted for automatic quality inspection in manufacturing processes. This article describes a general framework for classifying defects from high volume data batches…

Computer Vision and Pattern Recognition · Computer Science 2023-07-04 Wenbo Sun , Raed Al Kontar , Judy Jin , Tzyy-Shuh Chang

We present IMDD-1M, the first large-scale Industrial Multimodal Defect Dataset comprising 1,000,000 aligned image-text pairs, designed to advance multimodal learning for manufacturing and quality inspection. IMDD-1M contains high-resolution…

Computer Vision and Pattern Recognition · Computer Science 2026-01-13 TsaiChing Ni , ZhenQi Chen , YuanFu Yang

Defect detection plays a crucial role in infrared non-destructive testing systems, offering non-contact, safe, and efficient inspection capabilities. However, challenges such as low resolution, high noise, and uneven heating in infrared…

Computer Vision and Pattern Recognition · Computer Science 2023-11-20 Bozhen Hu , Bin Gao , Cheng Tan , Tongle Wu , Stan Z. Li

Steel surface defect analysis is critical for industrial quality control, yet existing benchmarks rely primarily on label-only annotations, limiting fine-grained semantic understanding and systematic evaluation of vision-language models. To…

Computer Vision and Pattern Recognition · Computer Science 2026-05-11 Shuxian Zhao , Jie Gui , Baosheng Yu , Dacheng Tao

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and…

Computer Vision and Pattern Recognition · Computer Science 2026-01-28 Emanuele Caruso , Alessandro Simoni , Francesco Pelosin

Recent advancements in quality control across various industries have increasingly utilized the integration of video cameras and image processing for effective defect detection. A critical barrier to progress is the scarcity of…

Computer Vision and Pattern Recognition · Computer Science 2024-06-13 Can Akbas , Irem Su Arin , Sinan Onal

Image generation can solve insufficient labeled data issues in defect detection. Most defect generation methods are only trained on a single product without considering the consistencies among multiple products, leading to poor quality and…

Computer Vision and Pattern Recognition · Computer Science 2024-08-02 Qingfeng Shi , Jing Wei , Fei Shen , Zhengtao Zhang

Effectively addressing the challenge of industrial Anomaly Detection (AD) necessitates an ample supply of defective samples, a constraint often hindered by their scarcity in industrial contexts. This paper introduces a novel algorithm…

Computer Vision and Pattern Recognition · Computer Science 2024-03-27 Hanxi Li , Zhengxun Zhang , Hao Chen , Lin Wu , Bo Li , Deyin Liu , Mingwen Wang

Visual defect detection in industrial glass manufacturing remains a critical challenge due to the low frequency of defective products, leading to imbalanced datasets that limit the performance of deep learning models and computer vision…

Computer Vision and Pattern Recognition · Computer Science 2025-07-30 Sajjad Rezvani Boroujeni , Hossein Abedi , Tom Bush

Current deep networks are very data-hungry and benefit from training on largescale datasets, which are often time-consuming to collect and annotate. By contrast, synthetic data can be generated infinitely using generative models such as…

Computer Vision and Pattern Recognition · Computer Science 2023-10-11 Weijia Wu , Yuzhong Zhao , Hao Chen , Yuchao Gu , Rui Zhao , Yefei He , Hong Zhou , Mike Zheng Shou , Chunhua Shen

Advancement in fundamental engineering aspects of software development enables IT enterprises to develop a more cost effective and better quality product through aptly organized defect management strategies. Inspection continues to be the…

Software Engineering · Computer Science 2012-06-05 T. R. Gopalakrishnan Nair , V Suma

Despite progress in vision-based inspection algorithms, real-world industrial challenges -- specifically in data availability, quality, and complex production requirements -- often remain under-addressed. We introduce the VISION Datasets, a…

Computer Vision and Pattern Recognition · Computer Science 2023-06-21 Haoping Bai , Shancong Mou , Tatiana Likhomanenko , Ramazan Gokberk Cinbis , Oncel Tuzel , Ping Huang , Jiulong Shan , Jianjun Shi , Meng Cao
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