Related papers: Calibration method for complex permittivity measur…
Systematic errors in detector calibration can bias signal analyses and potentially lead to incorrect interpretations suggesting violations of general relativity. In this study, we investigate how calibration systematics affect black hole…
Optical nanoscopy is crucial in life and materials sciences, revealing subtle cellular processes and nanomaterial properties. Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) provides nanoscale resolution, relying on the…
We describe a method to map the standing-wave pattern inside a Fabry-Perot optical cavity with sub-wavelength resolution by perturbing it with a commercially available scanning near-field optical microscope (SNOM) tip. The method is applied…
Validating material performance in electrical devices is crucial to product development. For Gallium Nitride (GaN) devices, evaluating material factors such as defects, dopant concentration, and overall production quality is essential to…
Scattering scanning near-field optical microscopy enables optical imaging and characterization of plasmonic devices with nanometer-scale resolution well below the diffraction limit. This technique enables developers to probe and understand…
Pseudo-heterodyne scattering-type scanning near-field optical microscopy (sSNOM) is applied in the mid-infrared region to detect the chemical composition of biomolecules on the nanoscale. However, the application of sSNOM in molecular…
Accurate determination of the complex effective permittivity is fundamental to optical material engineering, but it remains a critical metrology challenge for heterogeneous systems. In polymer blends and optical composites, scattering and…
In recent years several methods to overcome diffraction limit in the far field microscopy have been demonstrated. Still the problem of superresolution is reliably solved only for fluorescent microscopy, giving a resolution of up to 20-30nm.…
We analyze how a probing particle modifies the infrared electromagnetic near field of a sample. The particle, described by electric and magnetic polarizabilities, represents the tip of an apertureless scanning optical near-field microscope…
We have studied the formation of near-field fringes when sharp edges of materials are imaged using scattering-type scanning near-field optical microscope (s-SNOM). Materials we have investigated include dielectrics, metals, near-perfect…
Surround-View System (SVS) is an essential component in Advanced Driver Assistance System (ADAS) and requires precise calibrations. However, conventional offline extrinsic calibration methods are cumbersome and time-consuming as they rely…
Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (color centers in diamond,…
Scanning Thermal Microscopy (SThM) is a scanning probe technique aimed at quantitative characterization of local thermal properties at the length scale down to tens of nanometers. With many probe designs and approaches to interpretation of…
Near-field scanning optical microscopy has been an indispensable tool for designing, characterizing and understanding the functionalities of diverse nanoscale photonic devices. As the advances in fabrication technology have driven the…
Despite an emerging interest in MIMO radar, the utilization of its complementary strengths in combination with optical depth sensors has so far been limited to far-field applications, due to the challenges that arise from mutual sensor…
A generalization of the S-parameter retrieval method for finite three-dimensional inhomogeneous objects under arbitrary illumination and observation conditions is presented. The effective permittivity of such objects may be rigorously…
We propose a novel method for ultra-sensitive infrared (IR) vibrational spectroscopy of molecules with nanoscale footprints by combining the tip enhancement of the scattering-type scanning near-field optical microscope (s-SNOM) and the…
We theoretically and experimentally demonstrate a multifrequency excitation and detection scheme in apertureless near field optical microscopy, that exceeds current state of the art sensitivity and background suppression. By exciting the…
We investigate the radiation patterns of sharp conical gold tapers, designed as adiabatic nanofocusing probes for scanning near-field optical microscopy (SNOM). Field calculations show that only the lowest order eigenmode of such a taper…
This paper demonstrates a novel method to extract photomultiplier tube (PMT) calibration timing constants in large liquid scintillation detectors from physics data using the machinery of unsupervised deep learning. The approach uses a…