Related papers: Calibration method for complex permittivity measur…
Scanning photocurrent microscopy (SPCM) has been widely used for characterizing charge transport properties, in particular, the minority carrier diffusion length of semiconductors. However, studying lightly doped or intrinsic semiconductors…
We introduce a revised derivation of the bitwise Markov Chain Monte Carlo (MCMC) multiple-input multiple-output (MIMO) detector. The new approach resolves the previously reported high SNR stalling problem of MCMC without the need for…
Typical Structure-from-Motion (SfM) pipelines rely on finding correspondences across images, recovering the projective structure of the observed scene and upgrading it to a metric frame using camera self-calibration constraints. Solving…
This paper proposes a new approach, the symmetric-reciprocal-match (SRM) method, for calibrating vector network analyzers (VNAs). The method involves using multiple symmetric one-port loads, a two-port reciprocal device, and a matched load.…
We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 micron. The microscope is sensitive to the linear permittivity,…
The key to accurate 3D shape measurement in Fringe Projection Profilometry (FPP) is the proper calibration of the measurement system. Current calibration techniques rely on phase-coordinate mapping (PCM) or back-projection stereo-vision…
This paper describes the developed setup and characterization approach for full two-port calibrated S-parameter measurements at cryogenic temperatures, together with a complete uncertainty budget. The system developed at the Istituto…
Confined electron systems, such as 2D electron gases (2DEGs), 2D materials, or topological insulators show great technological promise but their susceptibility to defects often results in nanoscale inhomogeneities with unclear origins.…
We consider the application of relative self-calibration using overlap regions to spectroscopic galaxy surveys that use slit-less spectroscopy. This method is based on that developed for the SDSS by Padmanabhan at al. (2008) in that we…
Label-free imaging of rapidly moving, sub-diffraction sized structures has important applications in both biology and material science, as it removes the limitations associated with fluorescence tagging. However, unlabeled nanoscale…
The development of sensitive large format imaging arrays for the infrared promises to provide revolutionary capabilities for space astronomy. For example, the Infrared Array Camera (IRAC) on SIRTF will use four 256 x 256 arrays to provide…
The Nystr\"om methods have been popular techniques for scalable kernel based learning. They approximate explicit, low-dimensional feature mappings for kernel functions from the pairwise comparisons with the training data. However, Nystr\"om…
Material susceptibilities govern interactions between electromagnetic waves and matter and are of a crucial importance for basic understanding of natural phenomena and for tailoring practical applications. Here we present a new…
Low-resolution spectroscopy is a frequently used technique. Aperture prism spectroscopy in particular is an important tool for large-scale survey observations. The ongoing ESA space mission Gaia is the currently most relevant example. In…
An increasing number of machine learning models have been deployed in domains with high stakes such as finance and healthcare. Despite their superior performances, many models are black boxes in nature which are hard to explain. There are…
The stability and emissivity of the online calibration blackbody used in high-precision infrared remote sensing detectors in extreme environments are the primary limiting factors for their measurement accuracy. Due to the limitations of…
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for macroscopic imaging of the electrostatic potential above a surface. Though most often used to image work-function variations of conductive surfaces, it can also be used to…
The wavelength calibration of spectrographs is an essential but challenging task in many disciplines. Calibration is traditionally accomplished by imaging the spectrum of a light source containing features that are known to appear at…
In high-dimensional classification settings, we wish to seek a balance between high power and ensuring control over a desired loss function. In many settings, the points most likely to be misclassified are those who lie near the decision…
A method is described intended for distributed calibration of a probe microscope scanner consisting in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby each…