Related papers: Single-exposure x-ray dark-field imaging: quantify…
Single molecule X-ray scattering experiments with free electron lasers have opened a new route to the structure determination of biomolecules. Because typically only very few photons per scattering image are recorded and thus the…
The mechanisms for the formation of X-ray lines in the spectrum of SS 433 are investigated by taking into account the radiative transfer inside the jets. The results of Monte Carlo numerical simulations are presented. The effect of a…
Scattering-type scanning near-field optical microscopy is a powerful imaging technique for studying materials beyond the diffraction limit. However, interpreting near-field measurements poses challenges in mapping the response of…
Near-field communication comes to be an indispensable part of the future sixth generation (6G) communications at the arrival of the forth-coming deployment of extremely large-scale multiple-input-multiple-output (XL-MIMO) systems. Due to…
Many applications of short-wavelength radiation impose strong requirements on the coherence properties of the source. However, the measurement of such properties poses a challenge, mainly due to the lack of high-quality optics and source…
Phase Contrast Imaging (PCI), Dark-Field (DF) and Directional Dark-Field (DDF) imaging are recent X-ray imaging modalities that have demonstrated their interest by providing access to information and contrasts different from those provided…
The routine atomic-resolution structure determination of single particles is expected to have profound implications for probing the structure-function relationship in systems ranging from energy materials to biological molecules.…
Differential evolution indicators are introduced for 3D spatiotemporal imaging of micromechanical processes in complex materials where progressive variations due to manufacturing and/or aging are housed in a highly scattering background of…
In order to relate nanoparticle properties to function, fast and detailed particle characterization, is needed. The ability to characterize nanoparticle samples using optical microscopy techniques has drastically improved over the past few…
We present a method to measure the vector-field light scattering of individual microscopic objects. The polarization-dependent optical field images are measured with quantitative phase imaging at the sample plane, and then numerically…
Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films…
The scattering of polarized light incident from one dielectric medium on its two-dimensional randomly rough interface with a second dielectric medium is studied. A reduced Rayleigh equation for the scattering amplitudes is derived for the…
Imaging through scattering is a pervasive and difficult problem in many biological applications. The high background and the exponentially attenuated target signals due to scattering fundamentally limits the imaging depth of fluorescence…
We demonstrate the feasibility of obtaining accurate pair distribution functions of thin amorphous films down to 80 nm, using modern laboratory-based x-ray sources. The pair distribution functions are obtained using a single diffraction…
Unambiguous detection of signals superimposed on unknown trends is difficult for unevenly spaced data. Here, we formulate the Discrete Chi-square Method (DCM) that can determine the best model for many signals superimposed on arbitrary…
Photonic or electronic confinement effects in nanostructures become significant when one of their dimension is in the 5-300 nm range. Improving their development requires the ability to study their structure - shape, strain field,…
Offering high-brilliance X-ray beams on micrometer length scales, the microfocus-SAXS at SSRF BL16B1 was established with a KB mirror system for studying small sample volumes, or probing micro-scopic morphologies. The SAXS minimum q value…
To enhance the reflectivity of X-ray mirrors beyond the critical angle, multilayer coatings are required. Interface imperfections in the multilayer growth process are known to cause non-specular scattering and degrade the mirror optical…
In this study, we investigated the application of the direct sampling method (DSM) to identify small dielectric objects in a limited-aperture inverse scattering problem. Unlike previous studies, we consider the bistatic measurement…
Interferometric scattering microscopy is a powerful technique that enables various applications, such as mass photometry and particle tracking. Here we present a numerical toolbox to simulate images obtained in interferometric scattering,…