Measurements of polarization-dependent angle-resolved light scattering from individual microscopic samples using Fourier transform light scattering
Abstract
We present a method to measure the vector-field light scattering of individual microscopic objects. The polarization-dependent optical field images are measured with quantitative phase imaging at the sample plane, and then numerically propagated to the far-field plane. This approach allows the two-dimensional polarization-dependent angle-resolved light scattered patterns from individual object to be obtained with high precision and sensitivity. Using this method, we present the measurements of the polarization-dependent light scattering of a liquid crystal droplet and individual silver nanowires over scattering angles of 50{\deg}. In addition, the spectroscopic extension of the polarization-dependent angle-resolved light scattering is demonstrated using wavelength-scanning illumination.
Keywords
Cite
@article{arxiv.1712.06077,
title = {Measurements of polarization-dependent angle-resolved light scattering from individual microscopic samples using Fourier transform light scattering},
author = {Jaehwang Jung and Jinhyung Kim and Min-kyo Seo and YongKeun Park},
journal= {arXiv preprint arXiv:1712.06077},
year = {2018}
}