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Recent advances in scanning transmission electron and scanning probe microscopies have opened exciting opportunities in probing the materials structural parameters and various functional properties in real space with angstrom-level…

Conventional spectrometers are limited by trade-offs set by size, cost, signal-to-noise ratio (SNR), and spectral resolution. Here, we demonstrate a deep learning-based spectral reconstruction framework, using a compact and low-cost on-chip…

Computational imaging systems jointly design computation and hardware to retrieve information which is not traditionally accessible with standard imaging systems. Recently, critical aspects such as experimental design and image priors are…

Image and Video Processing · Electrical Eng. & Systems 2020-03-13 Michael Kellman , Jon Tamir , Emrah Boston , Michael Lustig , Laura Waller

Autonomous synthesis and characterization of inorganic materials requires the automatic and accurate analysis of X-ray diffraction spectra. For this task, we designed a probabilistic deep learning algorithm to identify complex multi-phase…

Materials Science · Physics 2021-05-27 Nathan J. Szymanski , Christopher J. Bartel , Yan Zeng , Qingsong Tu , Gerbrand Ceder

Spectroscopic ellipsometry (SE) has emerged as a powerful and non-destructive optical characterization technique for probing the complex dielectric properties of two-dimensional (2D) materials. This review provides a comprehensive overview…

Optical properties in solids, such as refractive index and absorption, hold vast applications ranging from solar panels to sensors, photodetectors, and transparent displays. However, first-principles computation of optical properties from…

Materials Science · Physics 2024-06-25 Nguyen Tuan Hung , Ryotaro Okabe , Abhijatmedhi Chotrattanapituk , Mingda Li

Ellipse fitting, an essential component in pupil or iris tracking based video oculography, is performed on previously segmented eye parts generated using various computer vision techniques. Several factors, such as occlusions due to eyelid…

Computer Vision and Pattern Recognition · Computer Science 2022-05-05 Rakshit S. Kothari , Aayush K. Chaudhary , Reynold J. Bailey , Jeff B. Pelz , Gabriel J. Diaz

Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor interfaces. In this work, solid-liquid interfaces are studied using the Kretschmann-Raether configuration for biosensing applications. The…

Establishing accurate morphological measurements of galaxies in a reasonable amount of time for future big-data surveys such as EUCLID, the Large Synoptic Survey Telescope or the Wide Field Infrared Survey Telescope is a challenge. Because…

Instrumentation and Methods for Astrophysics · Physics 2017-06-14 D. Tuccillo , M. Huertas-Company , E. Decenciere , S. Velasco-Forero

Characterization of materials via electron micrographs is an important and challenging task in several materials processing industries. Classification of electron micrographs is complex due to the high intra-class dissimilarity, high…

Computer Vision and Pattern Recognition · Computer Science 2024-09-11 Sakhinana Sagar Srinivas , Rajat Kumar Sarkar , Venkataramana Runkana

Scanning X-ray nanodiffraction microscopy is a powerful technique for spatially resolving nanoscale structural morphologies by diffraction contrast. One of the critical challenges in experimental nanodiffraction data analysis is posed by…

Applied Physics · Physics 2024-06-26 Aileen Luo , Tao Zhou , Martin V. Holt , Andrej Singer , Mathew J. Cherukara

Generalized ellipsometry, a non-destructive optical characterization technique, is employed to determine geometrical structure parameters and anisotropic dielectric properties of highly spatially coherent three-dimensionally nanostructured…

Optics · Physics 2015-06-16 Daniel Schmidt

Structural coloration is commonly modeled using wave optics for reliable and photorealistic rendering of natural, quasi-periodic and complex nanostructures. Such models often rely on dense, preliminary or preprocessed data to accurately…

Graphics · Computer Science 2025-07-03 Narayan Kandel , Daljit Singh J. S. Dhillon

Spectroscopic ellipsometry is a widely used optical technique both in industry and research for determining the optical properties and thickness of thin films. The effective use of spectroscopic ellipsometry on micro-structures is inhibited…

Optics · Physics 2023-02-28 Ralfy Kenaz , Ronen Rapaport

Strong gravitational lensing is a promising probe of the substructure of dark matter halos. Deep learning methods have the potential to accurately identify images containing substructure, and differentiate WIMP dark matter from other well…

Cosmology and Nongalactic Astrophysics · Physics 2020-04-09 Stephon Alexander , Sergei Gleyzer , Evan McDonough , Michael W. Toomey , Emanuele Usai

Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques to study 2D materials. However, a thorough description of the experimental setups needed to carry out these…

Optical tweezers exploit light--matter interactions to trap particles ranging from single atoms to micrometer-sized eukaryotic cells. For this reason, optical tweezers are a ubiquitous tool in physics, biology, and nanotechnology. Recently,…

In general, intrinsic image decomposition algorithms interpret shading as one unified component including all photometric effects. As shading transitions are generally smoother than reflectance (albedo) changes, these methods may fail in…

Computer Vision and Pattern Recognition · Computer Science 2021-01-22 Anil S. Baslamisli , Partha Das , Hoang-An Le , Sezer Karaoglu , Theo Gevers

Upcoming large astronomical surveys are expected to capture an unprecedented number of strong gravitational lensing systems. Deep learning is emerging as a promising practical tool for the detection and quantification of these galaxy-scale…

We have developed a conceptually new type of ellipsometry which allows the determination of the complex refractive index by simultaneously measuring the unpolarized normal-incidence reflectivity relative to the vacuum and to another…

Optics · Physics 2014-01-15 I. Kezsmarki , S. Bordacs