Micro-reflectance and transmittance spectroscopy: a versatile and powerful tool to characterize 2D materials
Abstract
Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques to study 2D materials. However, a thorough description of the experimental setups needed to carry out these measurements is lacking in the literature. We describe a versatile optical microscope setup to carry out differential reflectance and transmittance spectroscopy in 2D materials with a lateral resolution of ~1 micron in the visible and near-infrared part of the spectrum. We demonstrate the potential of the presented setup to determine the number of layers of 2D materials and to characterize their fundamental optical properties such as excitonic resonances. We illustrate its performance by studying mechanically exfoliated and chemical vapor-deposited transition metal dichalcogenide samples.
Keywords
Cite
@article{arxiv.1612.04145,
title = {Micro-reflectance and transmittance spectroscopy: a versatile and powerful tool to characterize 2D materials},
author = {Riccardo Frisenda and Yue Niu and Patricia Gant and Aday J. Molina-Mendoza and Robert Schmidt and Rudolf Bratschitsch and Jinxin Liu and Lei Fu and Dumitru Dumcenco and Andras Kis and David Perez De Lara and Andres Castellanos-Gomez},
journal= {arXiv preprint arXiv:1612.04145},
year = {2017}
}
Comments
5 main text figures + 1 table with all the part numbers to replicate the experimental setup + 4 supp. info. figures