English

Reflectance Hashing for Material Recognition

Computer Vision and Pattern Recognition 2015-02-10 v1

Abstract

We introduce a novel method for using reflectance to identify materials. Reflectance offers a unique signature of the material but is challenging to measure and use for recognizing materials due to its high-dimensionality. In this work, one-shot reflectance is captured using a unique optical camera measuring {\it reflectance disks} where the pixel coordinates correspond to surface viewing angles. The reflectance has class-specific stucture and angular gradients computed in this reflectance space reveal the material class. These reflectance disks encode discriminative information for efficient and accurate material recognition. We introduce a framework called reflectance hashing that models the reflectance disks with dictionary learning and binary hashing. We demonstrate the effectiveness of reflectance hashing for material recognition with a number of real-world materials.

Keywords

Cite

@article{arxiv.1502.02092,
  title  = {Reflectance Hashing for Material Recognition},
  author = {Hang Zhang and Kristin Dana and Ko Nishino},
  journal= {arXiv preprint arXiv:1502.02092},
  year   = {2015}
}
R2 v1 2026-06-22T08:24:25.034Z