Reflectance Hashing for Material Recognition
Abstract
We introduce a novel method for using reflectance to identify materials. Reflectance offers a unique signature of the material but is challenging to measure and use for recognizing materials due to its high-dimensionality. In this work, one-shot reflectance is captured using a unique optical camera measuring {\it reflectance disks} where the pixel coordinates correspond to surface viewing angles. The reflectance has class-specific stucture and angular gradients computed in this reflectance space reveal the material class. These reflectance disks encode discriminative information for efficient and accurate material recognition. We introduce a framework called reflectance hashing that models the reflectance disks with dictionary learning and binary hashing. We demonstrate the effectiveness of reflectance hashing for material recognition with a number of real-world materials.
Keywords
Cite
@article{arxiv.1502.02092,
title = {Reflectance Hashing for Material Recognition},
author = {Hang Zhang and Kristin Dana and Ko Nishino},
journal= {arXiv preprint arXiv:1502.02092},
year = {2015}
}