Optical micro-spectroscopy is an invaluable tool for studying and characterizing samples ranging from classical semiconductors to low-dimensional materials and heterostructures. To date, most implementations are based on point-scanning techniques, which are flexible and reliable, but slow. Here, we describe a setup for highly parallel acquisition of hyperspectral reflection and photoluminescence microscope images using a push-broom technique. Spatial as well as spectral distortions are characterized and their digital corrections are presented. We demonstrate close-to diffraction-limited spatial imaging performance and a spectral resolution limited by the spectrograph. The capabilities of the setup are demonstrated by recording a hyperspectral photoluminescence map of a CVD-grown MoSe2-WSe2 lateral heterostructure, from which we extract the luminescence energies, intensities and peak widths across the interface.
@article{arxiv.2305.06945,
title = {Hyperspectral photoluminescence and reflectance microscopy of 2D materials},
author = {David Tebbe and Marc Schütte and Baisali Kundu and Bernd Beschoten and Prasana K. Sahoo and Lutz Waldecker},
journal= {arXiv preprint arXiv:2305.06945},
year = {2023}
}