New type of ellipsometry in infrared spectroscopy: The double-reference method
Optics
2014-01-15 v1
Abstract
We have developed a conceptually new type of ellipsometry which allows the determination of the complex refractive index by simultaneously measuring the unpolarized normal-incidence reflectivity relative to the vacuum and to another reference media. From these two quantities the complex optical response can be directly obtained without Kramers-Kronig transformation. Due to its transparency and large refractive index over a broad range of the spectrum, from the far-infrared to the soft ultraviolet region, diamond can be ideally used as a second reference. The experimental arrangement is rather simple compared to other ellipsometric techniques.
Cite
@article{arxiv.0801.4333,
title = {New type of ellipsometry in infrared spectroscopy: The double-reference method},
author = {I. Kezsmarki and S. Bordacs},
journal= {arXiv preprint arXiv:0801.4333},
year = {2014}
}
Comments
submitted to Appl. Phys. Lett