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An extension of the Kramers-Kronig method for treatment of polarized infrared reflectance spectra from the face of low-symmetry crystals, where directions of principal dielectric axes depend on frequency, is proposed. It is shown, how to…
We developed a phase correction method for broadband terahertz time-domain spectroscopy in reflection geometry, which allows us to obtain quantitative and accurate values for the complex refractive index of materials. The process is…
We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric…
For a number of optical applications, it is advantageous to precisely tune the refractive index of a liquid. Here, we harness a well-established concept in optics for this purpose. The Kramers-Kronig relation provides physical connection…
Poly(methyl methacrylate), PMMA, is a popular polymer for optical applications due to its superior transmission and reflection. However, its optical properties in the ultraviolet regime still need to be thoroughly studied. Using the…
When the optical reflectance spectrum of a sample under high pressure is studied with a diamond anvil cell, it is measured at a sample/diamond interface. Due to the large refractive index of diamond, the resulting reflectance Rd(w) may…
Optical spectroscopy is indispensable for research and development in nanoscience and nanotechnology, microelectronics, energy, and advanced manufacturing. Advanced optical spectroscopy tools often require both specifically designed…
Two methods of refractometry in reflected light from optical surface of samples are considered and studied experimentally. Methods are grounded on results of Fresnel theory of concerning light reflectivity at near normal incidence and…
The Kramers-Kronig relations are a pivotal foundation of linear optics and atomic physics, embedding a physical connection between the real and imaginary components of any causal response function. A mathematically equivalent, but simpler,…
Reflectometry is a technique that uses the light reflected by a sample to determine properties of the sample. Interferometric reflectometry uses interference between two beams, one of which is incident on ---and reflected back by--- a…
We develop an approach to use nanostructured plasmonic materials as a non-magnetic negative-refractive index system at optical and near-infrared frequencies. In contrast to conventional negative refraction materials, our design does not…
This paper presents a simple and effective wideband method for the determination of material properties, such as the complex index of refraction and the complex permittivity and permeability. The method is explicit (non-iterative) and…
Ellipsometry is a technique whereby the measurement of the two orthogonal polarization components of light reflected at glancing incidence allows a characterization of the optical properties of a material at a particular frequency.…
White light spectral interferometry is applied to measure the refractive index in absorbing liquids in the spectral range from 400 to 1000 nm. We analyze the influence of absorption on the visibility of interferometric fringes and,…
Refractive index is a fundamental optical property of powder and a key input to the measurement of the size distribution using light scattering and the measurement of the absorption and scattering coefficients using diffuse reflectance…
We present the results of variable-angle spectroscopic ellipsometry and transmittance measurements to determine the variation of the complex refractive index of ion implanted single-crystal diamond. An increase is found in both real and…
We demonstrate applications of a novel scheme which is used for measuring refractive index and thickness of thin film by analyzing the relative phase difference and reflected ratio at reflection point of a monolithic folded Fabry-Perot…
In this work, we propose a novel method for the detailed reconstruction of transparent objects by exploiting polarimetric cues. Most of the existing methods usually lack sufficient constraints and suffer from the over-smooth problem. Hence,…
We developed a microscopy technique that can measure the local refractive index without sampling the optical phase delay of the electromagnetic radiation. To do this, we designed and experimentally demonstrated a setup with two co-localized…
Reflection phase imaging provides label-free, high-resolution characterization of biological samples, typically using interferometric-based techniques. Here, we investigate reflection phase microscopy from intensity-only measurements under…