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This paper describes the spherical concave mirror method for measuring the index of refraction of transparent liquids. We derived the refractive index equation using Snell's law and the small-angle approximation. We also verified the…
We introduce a systematic approach that enables two robust methods for performing terahertz time-domain spectroscopy in reflection geometry. Using the Kramers-Kronig relations in connection to accurate experimental measurements of the…
Several classical analogues of electromagnetically induced transparency in metamaterials have been demonstrated. A simple two-resonator model can describe their absorption spectrum qualitatively, but fails to provide information about the…
Imaging systems are inherently prone to aberrations. We present an optimization method to design two-dimensional freeform reflectors that minimize aberrations for various parallel ray beams incident on the optical system. We iteratively…
A novel method is proposed to measure the refractive indices (RIs) of the materials of different transparent solid state media. To exploit the advantage of non-contact measurement laser beam interferometry is used as an effective technique…
Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin films is complicated by the correlation of the dielectric…
In light refraction between two transparent media, Snell's law describes the relationship between the incident angle and refraction angle. The refractive index is usually determined from Snell's law using the minimum deviation angle through…
Materials combining both a high refractive index and a wide band gap are of great interest for optoelectronic and sensor applications. However, these two properties are typically described by an inverse correlation with high refractive…
This article aims to provide a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique in that information about the physical properties of a sample…
We propose an inverse method to design two-dimensional freeform imaging systems. We present the mathematical model to design a parallel-to-point double-reflector imaging system using inverse methods from nonimaging optics. We impose an…
We consider the inverse refractor and the inverse reflector problem. The task is to design a free-form lens or a free-form mirror that, when illuminated by a point light source, produces a given illumination pattern on a target. Both…
The imaging problem of a specular reflector is revisited. Retaining terms through second order in the reflector surface expansion, we derive the form of the aberration-limiting aperture for arbitrary magnification assuming no bandwidth…
In a recent experiment, the out-of-plane surface susceptibility of a single-layer two-dimensional atom crystal in the visible spectrum has been measured. This susceptibility gives a measurable contribution to the reflectivity of…
Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully…
Increasing the refractive index available for optical and nanophotonic systems opens new vistas for design: for applications ranging from broadband metalenses to ultrathin photovoltaics to high-quality-factor resonators, higher index…
We have theoretically proposed a highly compact refractive-index sensor consisted of edge-cavity and line-defect waveguide in two-dimensional photonic crystal. The sensing object is completely outside of the single enclosed surface of the…
A universal method of extraction of the complex dielectric function $\epsilon(\omega)=\epsilon_{1}(\omega)+i\epsilon_{2}(\omega)$ from experimentally accessible optical quantities is developed. The central idea is that…
We present here a new parametric resonance magnetometer scheme based on elliptically polarized pumping light and two radio-frequency fields applied along the two optical pumping directions. At optimum ellipticity and radio-frequency fields…
We extended a previous study of the Eaton lens at specific refraction angles to the Eaton lens at any refraction angle. The refractive index of the Eaton lens is complicated and has not analytical form except at a few specific angles. We…
Spectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. However, a conventional ellipsometer, which utilizes a mechanically rotating polarizer and grating-based…