We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration.
@article{arxiv.quant-ph/0110085,
title = {Ellipsometric measurements by use of photon pairs generated by spontaneous parametric down-conversion},
author = {Ayman F. Abouraddy and Kimani C. Toussaint, and Alexander V. Sergienko and Bahaa E. A. Saleh and Malvin C. Teich},
journal= {arXiv preprint arXiv:quant-ph/0110085},
year = {2012}
}
Comments
10 pages, accepted for publication in Optics Letters