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We developed a scan mirror mechanism (SMM) that enable a slit-based spectrometer or spectropolarimeter to precisely and quickly map an astronomical object. The SMM, designed to be installed in the optical path preceding the entrance slit,…
We present a new instrumentation and calibration procedure for terahertz time-domain spectroscopic ellipsometry (THz-TDSE) that is a newly established characterization technique. The experimental setup is capable of providing arbitrary…
Compared with conventional grating-based spectrometers, reconstructive spectrometers based on spectrally engineered filtering have the advantage of miniaturization because of the less demand for dispersive optics and free propagation space.…
Set-membership estimation (SME) outputs a set estimator that guarantees to cover the groundtruth. Such sets are, however, defined by (many) abstract (and potentially nonconvex) constraints and therefore difficult to manipulate. We present…
Metasurfaces enable exceptional control over the light with surface-confined planar components, offering the fascinating possibility of very dense integration and miniaturization in photonics. Here, we design, fabricate and experimentally…
We fabricated thin-films made from polydimethylsiloxane (PDMS) with embedded high-index (n~1.9-2.2) microspheres for super-resolution imaging applications. To control the position of microspheres, such films can be translated along the…
Modulation-enhanced localization microscopy (MELM) has demonstrated significant improvements in both lateral and axial localization precision compared to conventional single-molecule localization microscopy (SMLM). However, lateral…
Although several optical techniques have been recently developed in order to overcome the resolution limit in microscopy, the imaging of sub-wavelength features is still a real challenge. In practise, super-resolution techniques remain…
The possibility of spatially resolving the optical properties of atomically thin materials is especially appealing as they can be modulated at the micro- and nanoscale by reducing their thickness, changing the doping level or applying a…
In recent years, hyperspectral imaging, also known as imaging spectroscopy, has been paid an increasing interest in geoscience and remote sensing community. Hyperspectral imagery is characterized by very rich spectral information, which…
With the advent of microsphere assisted microscopy in 2011, this technique emerged as a simple and easy way to obtain optical super-resolution. Although the possible mechanisms of imaging by microspheres are debated in the literature, most…
Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…
We report the uniaxial anisotropic optical constants of Wurtzite type AlN films deposited on Si (100) substrate using DC reactive magnetron sputtering as a function of growth temperature (Ts, 35 to 600 C). Evolution of optical properties…
The Method of Ellipcenters (ME), introduced in~\cite{ME2025} for strongly convex quadratic minimization, uses two gradient evaluations per iteration: one at the current iterate and one at a companion point on the same level set. We extend…
Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor interfaces. In this work, solid-liquid interfaces are studied using the Kretschmann-Raether configuration for biosensing applications. The…
An ellipsometer is a vital precision tool used for measuring optical parameters with wide applications in many fields, including accurate measurements in film thickness, optical constants, structural profiles, etc. However, the precise…
Optical measurements of nanostructured GaSb prepared by sputtering is presented. The optical response is studied by Mueller Matrix Ellipsometry (MME) in the visible range (430--850nm), and by spectroscopic ellipsometry in the range…
Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques to study 2D materials. However, a thorough description of the experimental setups needed to carry out these…
In this work, we show that spectroscopic ellipsometry can be combined with photoemission spectroscopy to obtain complete interface band diagrams of non-ideal semiconductor heterointerfaces, such as interfaces between thin-film…
Laser speckle, the granular intensity pattern arising from random optical interference, provides a high-dimensional encoding of spectral information that can be exploited for precision metrology. Speckle-based spectrometers have advanced…