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Angle-resolved photoemission spectroscopy (ARPES) is the key momentum-resolved technique for direct probing of the electronic structure of a material. However, since it is very surface-sensitive, it has been applied to a relatively small…
Optical spectroscopy plays an essential role across scientific research and industry for non-contact materials analysis1-3, increasingly through in-situ or portable platforms4-6. However, when considering low-light-level applications,…
Inverse ellipsometry, i.e., reconstructing optical constants and film thickness from the measured phase difference $\Delta$ and amplitude ratio $\Psi$, is a fundamentally ill-posed problem. Traditional solutions rely on slow, expert-driven…
One of the problems of producing spectrographs for Extremely Large Telescopes (ELTs) is that the beam size is required to scale with telescope aperture if all other parameters are held constant, leading to enormous size and implied cost.…
The performance of electron energy-loss spectrometers can often be limited by their electron-optical aberrations. Due to recent developments in high energy-resolution and momentum-resolved electron energy loss spectroscopy (EELS), there is…
We propose a precise ellipsometric method for the investigation of coherent light with a small ellipticity. The main feature of this method is the use of compensators with phase delays providing the maximum accuracy of measurements for the…
Atomically thin PtSe2 films have attracted extensive research interests for potential applications in high-speed electronics, spintronics and photodetectors. Obtaining high quality, single crystalline thin films with large size is critical.…
Electron energy-loss spectroscopy (EELS) offers a window to view nanoscale properties and processes. When performed in a scanning transmission electron microscope, EELS can simultaneously render images of nanoscale objects with…
Compact spectrometers based on disordered planar waveguides exhibit a rather high resolution with a relatively small footprint as compared to conventional spectrometers. This is achieved by multiple scattering of light which - if properly…
The Scanning electron microscope (SEM) and Electron-Dispersive Spectroscope (EDS) are two highly effective instruments in the field of nanoscience and nanotechnology. The quality of these instruments is determined by various factors, with…
By using scattering in near field techniques, a microscope can be easily turned into a device measuring static and dynamic light scattering, very useful for the characterization of nanoparticle dispersions. Up to now, microscopy based…
Micromechanically exfoliated mono- and multilayers of molybdenum disulfide (MoS2) are investigated by spectroscopic imaging ellipsometry. In combination with knife edge illumination, MoS2 flakes can be detected and classified on arbitrary…
Optical spectroscopy the measurement of electromagnetic spectra is fundamental to various scientific domains and serves as the building block of numerous technologies. Computational spectrometry is an emerging field that employs an array of…
Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully…
We present an optical metrology system for characterization of topography of micro/nano-structures on a surface or embedded in a semi-transparent material. Based on the principles of scatterometry, where the intensity of scattered light is…
We have developed a state-of-the-art apparatus for laser-based spin- and angle-resolved photoemission spectroscopy with micrometer spatial resolution (micro-SARPES). This equipment is achieved through the combination of a high-resolution…
Super-resolution optical microscopy is a rapidly evolving scientific field dedicated to imaging sub-wavelength sized objects, leaving its mark in multiple branches of biology and technology. While several super-resolution optical microscopy…
Speckle photography can be used to monitor deformations of solid surfaces. The measuring characteristics, such as range or lateral resolution depend heavily on the optical recording and illumination set-up. This paper shows how, by the…
Generalized ellipsometry, a non-destructive optical characterization technique, is employed to determine geometrical structure parameters and anisotropic dielectric properties of highly spatially coherent three-dimensionally nanostructured…
Computational spectrometers are pivotal in enabling low-cost, in-situ and rapid spectral analysis, with potential applications in chemistry, biology, and environmental science. However, filter-based spectral encoding approaches typically…