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Transmission electron microscopy at very low energy is a promising way to avoid damaging delicate biological samples with the incident electrons, a known problem in conventional transmission electron microscopy. For imaging in the 0-30 eV…

Materials Science · Physics 2020-09-22 Peter S. Neu , Daniël Geelen , Aniket Thete , Rudolf M. Tromp , Sense Jan van der Molen

We demonstrate the feasibility of coincidence measurements in a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spectroscopy (EELS) and energy dispersive X-ray (EDX)…

Instrumentation and Detectors · Physics 2019-05-01 Daen Jannis , Knut Müller-Caspary , Armand Béché , Andreas Oelsner , Johan Verbeeck

We recast the Howie-Whelan equations for generating simulated transmission electron microscope (TEM) images, replacing the dependence on local atomic displacements with atomic positions only. This allows very rapid computation of simulated…

Materials Science · Physics 2024-09-04 D. R. Mason , M. Boleininger , J. Haley , E. Prestat , G. He , F. Hofmann , S. L. Dudarev

High-throughput analysis of multidimensional transmission electron microscopy (TEM) datasets remains a significant challenge, limiting the broader impact on strategic materials research. Conventional workflows typically involve sequential,…

Materials Science · Physics 2025-07-16 Arda Genc , Ravit Silverstein

Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology and materials science. In structural biology, three-dimensional structures of…

Beam damage is a major limitation in electron microscopy that becomes increasingly severe at higher resolution. One possible route to circumvent radiation damage, which forms the basis for single-particle electron microscopy and related…

The development of four-dimensional (4D) scanning transmission electron microscopy (STEM) using fast detectors has opened-up new avenues for addressing some of long-standing challenges in electron imaging. One of these challenges is how to…

Materials Science · Physics 2021-01-19 Yu-Tsun Shao , Renliang Yuan , Haw-Wen Hsiao , Qun Yang , Yang Hu , Jian-Min Zuo

Electrical impedance tomography (EIT) is highly affected by modeling errors regarding electrode positions and the shape of the imaging domain. In this work, we propose a new inclusion detection technique that is completely independent of…

Analysis of PDEs · Mathematics 2018-10-11 Bastian Harrach , Eunjung Lee , Marcel Ullrich

Spatially resolved electron energy-loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM) has been used to investigate as fluidic phase in nanoubbles embedded in a metallic Pd90Pt10 matrix. Using the 1s->2p…

Materials Science · Physics 2016-08-14 D. Taverna , M. Kociak , O. Stéphan , A. Fabre , E. Finot , B. Décamps , C. Colliex

Electron channeling contrast imaging (ECCI) is a scanning electron microscopy (SEM) based technique that enables bulk-sample characterization of crystallographic defects (e.g. dislocations, stacking faults, low angle boundaries). Despite…

Correlative light and electron microscopy is a powerful tool to study the internal structure of cells. It combines the mutual benefit of correlating light (LM) and electron (EM) microscopy information. However, the classical approach of…

Computer Vision and Pattern Recognition · Computer Science 2022-08-22 Fengjiao Ma , Rainer Kaufmann , Jaroslaw Sedzicki , Zoltán Cseresnyés , Christoph Dehio , Stephanie Hoeppener , Marc Thilo Figge , Rainer Heintzmann

Accurately determining the crystallographic structure of a material, organic or inorganic, is a critical primary step in material development and analysis. The most common practices involve analysis of diffraction patterns produced in…

In this work, a data-driven modeling framework of switched dynamical systems under time-dependent switching is proposed. The learning technique utilized to model system dynamics is Extreme Learning Machine (ELM). First, a method is…

Systems and Control · Electrical Eng. & Systems 2021-01-27 Weiming Xiang

Live-cell imaging of multiple subcellular structures is essential for understanding subcellular dynamics. However, the conventional multi-color sequential fluorescence microscopy suffers from significant imaging delays and limited number of…

Subcellular Processes · Quantitative Biology 2025-01-13 Mingyang Chen , Luhong Jin , Xuwei Xuan , Defu Yang , Yun Cheng , Ju Zhang

Recent advancements in high-resolution spectroscopy analyses within the scanning transmission electron microscope (STEM) have paved the way for measuring the concentration of chemical species in crystalline materials at the atomic scale.…

In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilization of deep…

Computer Vision and Pattern Recognition · Computer Science 2025-03-19 Ganesh Raghavendran , Bing Han , Fortune Adekogbe , Shuang Bai , Bingyu Lu , William Wu , Minghao Zhang , Ying Shirley Meng

Virtual beam diagnostics relies on computationally intensive beam dynamics simulations where high-dimensional charged particle beams evolve through the accelerator. We propose Latent Evolution Model (LEM), a hybrid machine learning…

Accelerator Physics · Physics 2026-02-27 Mahindra Rautela , Alexander Scheinker

Modern computational organic chemistry is becoming increasingly data-driven. There remain a large number of important unsolved problems in this area such as product prediction given reactants, drug discovery, and metric-optimized molecule…

Biomolecules · Quantitative Biology 2026-02-10 Josh Payne , Mario Srouji , Dian Ang Yap , Vineet Kosaraju

The photon flux resulting from high-energy electron beam interactions with high field systems, such as in the upcoming FACET-II experiments at SLAC National Accelerator Laboratory, may give deep insight into the electron beam's underlying…

Accelerator Physics · Physics 2023-09-26 M. Yadav , M. Oruganti , S. Zhang , B. Naranjo , G. Andonian , Y. Zhuang , Ö. Apsimon , C. P. Welsch , J. B. Rosenzweig

Automated analysis of electron microscopy datasets poses multiple challenges, such as limitation in the size of the training dataset, variation in data distribution induced by variation in sample quality and experiment conditions, etc. It…

Materials Science · Physics 2022-09-07 Arun Baskaran , Yulin Lin , Jianguo Wen , Maria K. Y. Chan