Related papers: Subnanometer Accuracy of Surface Characterization …
The resolution of optical imaging devices is ultimately limited by the diffraction of light. To circumvent this limit, modern super-resolution microscopy techniques employ active interaction with the object by exploiting its optical…
We present topological derivative and energy based procedures for the imaging of micro and nanostructures using one beam of visible light of a single wavelength. Objects with diameters as small as 10 nm can be located, and their position…
Optical Coherence Tomography (OCT) is a key 3D imaging technology that provides micron scale depth resolution for bio-imaging. This resolution substantially surpasses what it typically achieved in Light Detection and Ranging (LiDAR) which…
We present differentiable point-based inverse rendering, DPIR, an analysis-by-synthesis method that processes images captured under diverse illuminations to estimate shape and spatially-varying BRDF. To this end, we adopt point-based…
Differentiable rendering has received increasing interest for image-based inverse problems. It can benefit traditional optimization-based solutions to inverse problems, but also allows for self-supervision of learning-based approaches for…
Images acquired by computer vision systems under low light conditions have multiple characteristics like high noise, lousy illumination, reflectance, and bad contrast, which make object detection tasks difficult. Much work has been done to…
We consider blind ptychography, an imaging technique which aims to reconstruct an object of interest from a set of its diffraction patterns, each obtained by a local illumination. As the distribution of the light within the illuminated…
We present a method for estimating detailed scene illumination using human faces in a single image. In contrast to previous works that estimate lighting in terms of low-order basis functions or distant point lights, our technique estimates…
A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast…
Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface…
We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The…
A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…
I present a semiclassical analysis of a spatial-mode demultiplexing (SPADE) measurement scheme for far-field incoherent optical imaging under the effects of diffraction and photon shot noise. Building on previous results that assume two…
We describe a diffraction microscopy technique based on refractive optics to study structural variations in crystals. The X-ray beam diffracted by a crystal was magnified by beryllium parabolic refractive lenses on a 2D X-ray camera. The…
Reconfigurable intelligent surface (RIS) or intelligent reflecting surface (IRS) has been an attractive technology for future wireless communication and sensing systems. However, in the practical RIS, the mutual coupling effect among RIS…
Among the applications of optical phase measurement, the differential interference contrast microscope is widely used for the evaluation of opaque materials or biological tissues. However, the signal to noise ratio for a given light…
Phase-sensitive coherent imaging exploits changes in the phases of backscattered light to observe tiny alterations of scattering structures or variations of the refractive index. But moving scatterers or a fluctuating refractive index…
In this paper, we develop a novel phase retrieval approach to reconstruct x-ray differential phase shift induced by an object. A primary advantage of our approach is a higher-order accuracy over that with the conventional linear…
White light scanning interference (WLSI) microscopes provide an accurate surface topography of engineered surfaces. However, the measurement accuracy is substantially reduced in surfaces with low-reflectivity regions or high roughness, like…
Neural reflectance models are capable of reproducing the spatially-varying appearance of many real-world materials at different scales. Unfortunately, existing techniques such as NeuMIP have difficulties handling materials with strong…