Sub-wavelength surface IR imaging of soft-condensed matter
Biological Physics
2015-05-20 v1 Soft Condensed Matter
Instrumentation and Detectors
Abstract
Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.
Keywords
Cite
@article{arxiv.1010.5929,
title = {Sub-wavelength surface IR imaging of soft-condensed matter},
author = {James H. Rice and Graeme A. Hill and Stephen R. Meech and Paulina Kuo and Konstantin Vodopyanov and Michael Reading},
journal= {arXiv preprint arXiv:1010.5929},
year = {2015}
}