Related papers: Subnanometer Accuracy of Surface Characterization …
Previous multi-view normal integration methods typically sample a single ray per pixel, without considering the spatial area covered by each pixel, which varies with camera intrinsics and the camera-to-object distance. Consequently, when…
Many adaptive optics systems operate by measuring the distortion of the wavefront in one wavelength range and performing the scientific observations in a second, different wavelength range. One common technique is to measure wavefront…
There is widespread interest in estimating the fluorescence properties of natural materials in an image. However, the separation between reflected and fluoresced components is difficult, because it is impossible to distinguish reflected and…
Determining the dimensions of nanostructures is critical to ensuring the maximum performance of many geometry-sensitive nanoscale functional devices. However, accurate metrology at the nanoscale is difficult using optics-based methods due…
We present a differentiable framework to adaptively compute 4D illumination conditions with respect to an object, for efficient, high-quality simultaneous acquisition of its shape and reflectance, with a unified spatial-angular structured…
Measurements of microscale surface patterns are essential for process and quality control in industries across semiconductors, micro-machining, and biomedicines. However, the development of miniaturized and intelligent profiling systems…
Unprecedented atomic-scale measurement resolution has recently been demonstrated in single-shot optical localization metrology based on deep-learning analyses of diffraction patterns of topologically structured light scattered from objects.…
We studied the resonant diffraction signal from stepped surfaces of SrTiO3 at the Ti 2p -> 3d (L2,3) resonance in comparison with x-ray absorption (XAS) and specular reflectivity data. The steps on the surface form an artificial…
Many nano and quantum devices, with their sizes often spanning from millimeters down to sub-nanometer, have intricate low-dimensional, non-uniform, or hierarchical structures on surfaces and interfaces. Since their functionalities are…
Many nanophotonic applications require precise control and characterization of electromagnetic field properties at the nanoscale. The chiral properties of the field are among its key characteristics, yet measurement of optical chirality at…
Classification of features in a scene typically requires conversion of the incoming photonic field into the electronic domain. Recently, an alternative approach has emerged whereby passive structured materials can perform classification…
Optical microscopy is believed to be an efficient method for identifying layer number of two-dimensional 2D materials. However, since illuminants, cameras and their parameters are different from lab to lab, it is impossible to identify…
The spatially precise integration of arrays of micro-patterned two-dimensional (2D) crystals onto three-dimensionally structured Si/SiO$_2$ substrates represents an attractive strategy towards the low-cost system-on-chip integration of…
Precise calibration is a must for high reliance 3D computer vision algorithms. A challenging case is when the camera is behind a protective glass or transparent object: due to refraction, the image is heavily distorted; the pinhole camera…
Capturing the 3D geometry of transparent objects is a challenging task, ill-suited for general-purpose scanning and reconstruction techniques, since these cannot handle specular light transport phenomena. Existing state-of-the-art methods,…
Proposed, justified and tested measuring of beam spatial coherence, based on the detection of an interference visibility of the equal to intensity of beam replicas emerging under reflection from the rotated plane-parallel plate. The method…
We introduce "microdeflectometry", a novel technique for measuring the microtopography of specular surfaces. The primary data is the local slope of the surface under test. Measuring the slope instead of the height implies high information…
We introduce a nanomechanical platform for fast and sensitive measurements of the spectrally-resolved optical dielectric function of 2D materials. At the heart of our approach is a suspended 2D material integrated into a nanomechanical…
We present an interferometric spectral-domain optical coherence tomography microscopy setup to detect structural changes using interference of light reflected from different interfaces of the sample. We induce a reproducible nanometer-scale…
This paper presents a process for estimating the spatially varying surface reflectance of complex scenes observed under natural illumination. In contrast to previous methods, our process is not limited to scenes viewed under controlled…