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Electron backscatter diffraction is a powerful tool for mapping crystallographic microstructures. However, the primary crux to improving orientation accuracy and applying the technique to challenging materials lies in the correct…

Materials Science · Physics 2026-04-29 Claire Griesbach , Dennis M. Kochmann

Diffraction gratings with large angular dispersion rates are central to obtaining high spectral resolution in grating spectrometers operating over a broad spectral range from infrared to soft-x-ray domains. The greatest challenge is of…

Optics · Physics 2021-05-18 Yuri Shvyd'ko

Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved mapping of lattice structure over a wide range of length scales. However, intensity variations caused by…

In recent years, halide perovskite materials have been used to make high performance solar cell and light-emitting devices. However, material defects still limit device performance and stability. Here, we use synchrotron-based Bragg…

The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray…

Materials Science · Physics 2024-11-12 Trygve Magnus Ræder , Urko Petralanda , Thomas Olsen , Hugh Simons

We consider a method for neutron residual strain/stress analysis combining features of transmission strain tomography (e.g. through Braggs edge imaging) and neutron diffraction techniques. Analogous to transmission strain tomography, our…

Applied Physics · Physics 2019-06-18 V. Luzin , A. W. T. Gregg , J. N. Hendriks , C. M. Wensrich

X-ray diffraction based microscopy techniques such as High Energy Diffraction Microscopy rely on knowledge of the position of diffraction peaks with high precision. These positions are typically computed by fitting the observed intensities…

Image and Video Processing · Electrical Eng. & Systems 2021-06-04 Zhengchun Liu , Hemant Sharma , Jun-Sang Park , Peter Kenesei , Antonino Miceli , Jonathan Almer , Rajkumar Kettimuthu , Ian Foster

Electron Backscatter Diffraction (EBSD) is a technique to obtain microcrystallographic information from materials by collecting large-angle Kikuchi patterns in the scanning electron microscope (SEM). An important fundamental question…

Materials Science · Physics 2019-03-06 Aimo Winkelmann , T. Ben Britton , Gert Nolze

ADP crystals of large dimensions (80x80x20 mm3), to be used as a X-ray beam expanders in the BEaTriX facility at INAF-OABrera, have been characterised at BM05 beamline at ESRF synchrotron with the main purpose to determine lattice plane…

The fourth flight of the Focusing Optics X-ray Solar Imager sounding rocket experiment (FOXSI-4) aimed to achieve the first imaging spectroscopic observations of mid-to-large class ( >= GOES C5 class) solar flares, in contrast to the…

Instrumentation and Methods for Astrophysics · Physics 2025-03-18 Shunsaku Nagasawa , Takahiro Minami , Shin Watanabe , Tadayuki Takahashi

Scanning precession electron diffraction (SPED) is a powerful technique for investigating strain. While extensive literature exists analysing strain under high convergence angle conditions there are few systematic studies describing work…

The spectral dependence of the Bragg peak position under conditions of extremely asymmetric diffraction has been analyzed in the kinematical and dynamical approximations of the diffraction theory. Simulations have been performed for the…

Materials Science · Physics 2025-04-28 M A Andreeva , Yu. Repchenko , A G Smekhova , Karine Dumesnil , F. Wilhelm , A. Rogalev

Electron backscatter diffraction is a widely used technique for nano- to micro-scale analysis of crystal structure and orientation. Backscatter patterns produced by an alloy solid solution matrix and its ordered superlattice exhibit only…

Materials Science · Physics 2020-10-13 Thomas P McAuliffe , David Dye , T Ben Britton

This study presents an optimized hybrid design integrating a distributed Bragg reflector (DBR) and a TiO2 nanocylinder metasurface to enhance light extraction efficiency (LEE) and beam directionality(narrow divergence angle) in…

Optics · Physics 2025-05-30 Hanbo Xu , Xinyang Liu , Lei Wang

We propose a framework for indexing of grain and sub-grain structures in electron backscatter diffraction (EBSD) images of polycrystalline materials. The framework is based on a previously introduced physics-based forward model by Callahan…

Computer Vision and Pattern Recognition · Computer Science 2015-03-04 Yu-Hui Chen , Se Un Park , Dennis Wei , Gregory Newstadt , Michael Jackson , Jeff P. Simmons , Marc De Graef , Alfred O. Hero

AxFe2-ySe2 (A=K, Rb, Cs) superconductors may show a complex mixture of structural phases even in a single crystal form. A full sphere of the diffraction intensity has been collected, with the help of synchrotron radiation, for Cs0.8Fe1.6Se2…

Diffraction analysis in four dimensional scanning transmission electron microscopy now enables the mapping of local structures including symmetry, strain, and polarization of materials. However, measuring the distribution of these…

Materials Science · Physics 2024-06-19 Tim B. Eldred , Jacob G. Smith , Wenpei Gao

Technological developments in high resolution time-of-flight neutron detectors have raised the prospect of tomographic reconstruction of elastic strain fields from Bragg-edge strain images. This approach holds the potential to provide a…

Instrumentation and Detectors · Physics 2019-07-09 J. N. Hendriks , A. W. T. Gregg , C. M. Wensrich , A. S. Tremsin , T. Shinohara , M. Meylan , E. H. Kisi , V. Luzin , O. Kirsten

Recently, a number of reconstruction algorithms have been presented for residual strain tomography from Bragg-edge neutron transmission measurements. In this paper, we examine whether strain tomography can also be achieved from diffraction…

Computational Physics · Physics 2020-01-29 A. W. T. Gregg , J. N. Hendriks , C. M. Wensrich , V. Luzin , A. Wills

Microstructural analysis with electron backscatter diffraction (EBSD) involves sectioning and polishing to create a flat and preparation-artifact free surface. The quality of EBSD analysis is often dependant on this step, and this motivates…

Materials Science · Physics 2022-03-31 Ning Fang , Ruth Birch , T. Ben Britton