Electron backscatter diffraction is a widely used technique for nano- to micro-scale analysis of crystal structure and orientation. Backscatter patterns produced by an alloy solid solution matrix and its ordered superlattice exhibit only extremely subtle differences, due to the inelastic scattering that precedes coherent diffraction. We show that unsupervised machine learning (with PCA, NMF, and an autoencoder neural network) is well suited to fine feature extraction and superlattice/matrix classification. Remapping cluster average patterns onto the diffraction sphere lets us compare Kikuchi band profiles to dynamical simulations, confirm the superlattice stoichiometry, and facilitate virtual imaging with a spherical solid angle aperture. This pipeline now enables unparalleled mapping of exquisite crystallographic detail from a wide range of materials within the scanning electron microscope.
@article{arxiv.2005.10581,
title = {Spherical-angular dark field imaging and sensitive microstructural phase clustering with unsupervised machine learning},
author = {Thomas P McAuliffe and David Dye and T Ben Britton},
journal= {arXiv preprint arXiv:2005.10581},
year = {2020}
}