We report a first exploration of High-angular-Resolution Electron Backscatter Diffraction, without using simulated Electron Backscatter Diffraction patterns as a reference, for absolute stress and orientation measurements in polycrystalline materials. By co-correlating the pattern center and fully exploiting crystal symmetry and plane-stress, simultaneous correlation of all overlapping regions of interest in multiple direct-electron-detector, energy-filtered Electron Backscatter Diffraction patterns is achieved. The potential for highly accurate measurement of absolute stress, crystal orientation and pattern center is demonstrated on a virtual polycrystalline case-study, showing errors respectively below 20 MPa (or 1e-4 in strain), 7e-5 rad and 0.06 pixels.
@article{arxiv.1807.03908,
title = {Demonstrating the potential of Accurate Absolute Cross-grain Stress and Orientation correlation using Electron Backscatter Diffraction},
author = {Tijmen Vermeij and Marc De Graef and Johan Hoefnagels},
journal= {arXiv preprint arXiv:1807.03908},
year = {2018}
}
Comments
Manuscript as accepted for publication in Scripta Materialia