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The Scanning electron microscope (SEM) and Electron-Dispersive Spectroscope (EDS) are two highly effective instruments in the field of nanoscience and nanotechnology. The quality of these instruments is determined by various factors, with…

Applied Physics · Physics 2023-10-24 Hamidreza Moradi , Fatemeh Mehradnia

Bragg interferometry (BI) is an imaging technique based on four-dimensional scanning electron microscopy (4D-STEM) wherein the intensities of select overlapping Bragg disks are fit or more qualitatively analyzed in the context of simple…

Materials Science · Physics 2024-09-09 Isaac M. Craig , Madeline Van Winkle , Colin Ophus , D. Kwabena Bediako

To engineer the next generation of advanced materials we must understand their microstructure, and this requires microstructural characterization. This can be achieved through the collection of high contrast, data rich, and insightful…

Materials Science · Physics 2024-01-09 Tianbi Zhang , T. Ben Britton

Accurate quantification of the energy distribution of backscattered electrons (BSEs) contributing to electron backscatter diffraction (EBSD) patterns remains as an active challenge. This study introduces an energy-resolved EBSD methodology…

Analysis of distortions of the crystal lattice within individual mineral grains is central to the investigation of microscale processes that control and record tectonic events. These distortions are generally combinations of lattice…

Materials Science · Physics 2019-06-04 David Wallis , Lars N. Hansen , T. Ben Britton , Angus J. Wilkinson

Achieving atomic precision in top-down manufacturing remains a fundamental challenge nanofabrication technology. Here, the focused electron beam of a scanning transmission electron microscope is used to demonstrate atomically precise…

Materials Science · Physics 2026-02-20 Ondrej Dyck , Andrew R. Lupini , Ivan Vlassiouk , Matthew Brahlek , Rob Moore , Stephen Jesse

Precession of a converged beam during acquisition of a 4D-STEM dataset improves strain, orientation, and phase mapping accuracy by averaging over continuous angles of illumination. Precession experiments usually rely on integrated systems,…

Instrumentation and Detectors · Physics 2025-10-20 Stephanie M. Ribet , Rohan Dhall , Colin Ophus , Karen C. Bustillo

Scanning electron microscopy combined with electron backscatter diffraction (EBSD) and electron channeling provides rich crystallographic contrast, but the mutual influence of channeling-in and channeling-out is often simplified or…

Materials Science · Physics 2026-04-28 T. Ben Britton , M. Haroon Qaiser , Ruth M. Birch

Convergent-beam electron diffraction (CBED) is a well-established probe for spatial symmetries of crystalline samples, mainly exploiting the well-defined mapping between the diffraction groups (symmetry group of CBED patterns) and the…

Mesoscale and Nanoscale Physics · Physics 2025-11-18 O. Zaiets , C. Timm , J. Rusz , J. -Á. Castellanos-Reyes , S. Subakti , A. Lubk

Bicontinuous Pickering emulsions (bijels) are a physically interesting class of soft materials with many potential applications including catalysis, microfluidics and tissue engineering. They are created by arresting the spinodal…

Soft Condensed Matter · Physics 2022-03-07 M. Reeves , J. H. J. Thijssen

Restructuring of electronic spectrum in a buckled silicene monolayer under some applied voltage between its two sublattices and in presence of certain impurity atoms is considered. A special attention is given to formation of localized…

Disordered Systems and Neural Networks · Physics 2016-01-20 Yuriy G. Pogorelov , Vadim M. Loktev

Focused ion beam (FIB) techniques have been frequently used to section metal-halide perovskites for microstructural investigations. However, the ion beams directly irradiated to the sample surface may alter the properties far different from…

Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga+), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter…

Materials characterization using electron backscatter diffraction (EBSD) requires indexing the orientation of the measured region from Kikuchi patterns. The quality of Kikuchi patterns can degrade due to pattern overlaps arising from two or…

Materials Science · Physics 2024-06-07 Ashish Chauniyal , Pascal Thome , Markus Stricker

Electrospray ion-beam deposition (ES-IBD) is a versatile tool to study structure and reactivity of molecules from small metal clusters to large protein assemblies. It brings molecules gently into the gas phase where they can be accurately…

Ion Beam Sputtering (IBS) is a cost-effective technique able to produce ordered nanopatterns on the surfaces of different materials. To date, most theoretical studies of this process have focused on systems which become amorphous under…

Mesoscale and Nanoscale Physics · Physics 2016-05-04 Javier Renedo , Javier Muñoz-García , Mario Castro , Rodolfo Cuerno

Low-energy electron diffraction (LEED) is a cornerstone technique for determining surface atomic structures[heldStructureDeterminationLowenergy2025], yet the quantitative analysis of electron diffraction intensity as a function of incident…

Computational Physics · Physics 2026-04-07 Xiankang Tang , Ruiwen Xie , Jan P. Hofmann , Hongbin Zhang

We use ultrasensitive electron backscatter diffraction (EBSD) to map the local crystal orientations, grains, and grain boundaries in CH3NH3PbI3 (MAPI) perovskite thin films. Although the true grain structure is broadly consistent with the…

Micro-fabrication in diamond is involved in a wide set of emerging technologies, exploiting the exceptional characteristics of diamond for application in bio-physics, photonics, radiation detection. Micro ion-beam irradiation and pulsed…

Diffraction analysis in four dimensional scanning transmission electron microscopy now enables the mapping of local structures including symmetry, strain, and polarization of materials. However, measuring the distribution of these…

Materials Science · Physics 2024-06-19 Tim B. Eldred , Jacob G. Smith , Wenpei Gao